Probing the Edges between Stability and Degradation of a Series of ZnSe-Based Layered Hybrid Semicon

Yan, Mengwen; Myers, Christopher A.; John, Gregory M.; Meyers, Vincent E.; Chen, Alan A.; Feldblyum, Jeremy I.

doi:10.1002/admi.202200347

Probing the Edges between Stability and Degradation of a Series of ZnSe-Based Layered Hybrid Semicon

Journal Article · 01 July 2022 · Adv. Mater. Interfaces

DOI:https://doi.org/10.1002/admi.202200347· OSTI ID:1900648

Yan, Mengwen; Myers, Christopher A.; John, Gregory M.; Meyers, Vincent E.; Chen, Alan A.; Feldblyum, Jeremy I.

Research Organization:: Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)

Sponsoring Organization:: DOE - Office Of Science; NSF; UNIVERSITY

OSTI ID:: 1900648

Journal Information:: Adv. Mater. Interfaces, Journal Name: Adv. Mater. Interfaces Journal Issue: (20) Vol. 9

Country of Publication:: United States

Language:: ENGLISH

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