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Time-resolved chemical studies via time-of-flight secondary ion mass spectrometry

Patent ·
OSTI ID:1893012
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A method of performing time-of-flight secondary ion mass spectrometry on a sample includes the step of directing a beam of primary ions to the sample, and stimulating the migration of ions within the sample while the beam of primary ions is directed at the sample. The stimulation of the ions is cycled between a stimulation state and a lower stimulation state. Secondary ions emitted from the sample by the beam of primary ions are collected in a time-of-flight mass spectrometer. Time-of-flight secondary ion mass spectrometry is then performed on the secondary ions. A system for performing time-of-flight secondary ion mass spectrometry on a sample is also disclosed.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-00OR22725
Assignee:
UT-Battelle, LLC (Oak Ridge, TN); University of Tennessee Research Foundation (Knoxville, TN)
Patent Number(s):
11,355,336
Application Number:
17/174,968
OSTI ID:
1893012
Country of Publication:
United States
Language:
English

References (5)

Spatially Resolved Carrier Dynamics at MAPbBr 3 Single Crystal–Electrode Interface journal October 2019
Strain–Chemical Gradient and Polarization in Metal Halide Perovskites journal April 2020
Exploration of Electrochemical Reactions at Organic–Inorganic Halide Perovskite Interfaces via Machine Learning in In Situ Time‐of‐Flight Secondary Ion Mass Spectrometry journal July 2020
Direct Observation of Photoinduced Ion Migration in Lead Halide Perovskites journal November 2020
Hysteretic Ion Migration and Remanent Field in Metal Halide Perovskites journal August 2020

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