System and method for assessing spectroscopic sensor accuracy

Green, William J.; Zhang, Eric

System and method for assessing spectroscopic sensor accuracy

Patent · 24 May 2022

OSTI ID:1892961

Green, William J.; Zhang, Eric

A method for assessing spectroscopic sensor accuracy, includes building an a priori simulation of generalized etalon drift. A spectroscopic sensor is tested to determine use parameters. A specific drift model is generated by applying the determined use parameters to the built a priori simulation of generalized etalon drift. The specific drift model is analyzed to determine whether the spectroscopic sensor is satisfactory.

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Research Organization:: International Business Machines Corp., Armonk, NY (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AR0000540

Assignee:: International Business Machines Corporation (Armonk, NY)

Patent Number(s):: 11,340,110

Application Number:: 16/123,859

OSTI ID:: 1892961

Country of Publication:: United States

Language:: English

References (15)

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