Methods and systems for analysis

Pan, Shanlin; Hill, Caleb M.

Methods and systems for analysis

Patent · 15 February 2022

OSTI ID:1892614

Pan, Shanlin; Hill, Caleb M.

Provided herein are systems and methods for the detection, quantification, and/or monitoring of analytes in samples. The systems and methods can be used, for example, to track the deposition and electrochemical behavior of individual nanoparticles and nanoparticles clusters clusters in situ with high spatial and temporal resolution. The systems and methods can be used to track the deposition and oxidation of several hundreds to thousands of nanoparticles simultaneously and reconstruct their voltammetric curves at the single nanoparticle level.

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Research Organization:: Univ. of Alabama, Tuscaloosa, AL (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: SC0005392

Assignee:: The Board of Trustees of the University of Alabama (Tuscaloosa, AL)

Patent Number(s):: 11,249,046

Application Number:: 16/676,603

OSTI ID:: 1892614

Country of Publication:: United States

Language:: English

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