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Scanning tunneling thermometer

Patent ·
OSTI ID:1892506
Various examples are provided related to scanning tunneling thermometers and scanning tunneling microscopy (STM) techniques. In one example, a method includes simultaneously measuring conductance and thermopower of a nanostructure by toggling between: applying a time modulated voltage to a nanostructure disposed on an interconnect structure, the time modulated voltage applied at a probe tip positioned over the nanostructure, while measuring a resulting current at a contact of the interconnect structure; and applying a time modulated temperature signal to the nanostructure at the probe tip, while measuring current through a calibrated thermoresistor in series with the probe tip. In another example, a device includes an interconnect structure with connections to a first reservoir and a second reservoir; and a scanning tunneling probe in contact with a probe reservoir. Electrical measurements are simultaneously obtained for temperature and voltage applied to a nanostructure between the reservoirs.
Research Organization:
Univ. of Arizona, Tucson, AZ (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
SC0006699
Assignee:
Arizona Board of Regents on Behalf of the University of Arizona (Tucson, AZ)
Patent Number(s):
11,215,636
Application Number:
17/092,722
OSTI ID:
1892506
Country of Publication:
United States
Language:
English

References (5)

Simultaneous Determination of Conductance and Thermopower of Single Molecule Junctions journal December 2011
Fundamental aspects of steady-state conversion of heat to work at the nanoscale journal June 2017
Temperature mapping of operating nanoscale devices by scanning probe thermometry journal March 2016
Temperature and voltage measurement in quantum systems far from equilibrium journal October 2016
Local thermometry of self-heated nanoscale devices conference December 2016

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