Understanding the Effects of DRAM Correctable Error Logging at Scale.

Conference · 01 July 2021

DOI:https://doi.org/10.1109/Cluster48925.2021.00060· OSTI ID:1881688

Ferreira, Kurt; Levy, Scott; Kuhns, Victor; DeBardelaben, Nathan; Blanchard, Sean

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: NA0003525
• OSTI ID: 1881688
• Report Number(s): SAND2021-9208C; 697700
• Resource Type: Conference paper
• Conference Information: Proposed for presentation at the IEEE Cluster Conference held September 7-10, 2021 in Portland, OR.
• Country of Publication: United States
• Language: English