Path towards a vertical TFET enabled by atomic precision advanced manufacturing.
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- Advanced Manufacturing Office
- DOE Contract Number:
- NA0003525
- OSTI ID:
- 1872185
- Report Number(s):
- SAND2021-6772C; 696718
- Resource Relation:
- Conference: Proposed for presentation at the Silicon Nanoelectronics Workshop 2021 held June 13, 2021 in virtual.
- Country of Publication:
- United States
- Language:
- English
Similar Records
Modeling and Assessment of Atomic Precision Advanced Manufacturing (APAM) Enabled Vertical Tunneling Field Effect Transistor.
Modeling and Assessment of Atomic Precision Advanced Manufacturing (APAM) Enabled Vertical Tunneling Field Effect Transistor.
Current Paths in an Atomic Precision Advanced Manufactured Device Imaged by Nitrogen Vacancy Diamond Magnetic Microscopy.
Conference
·
2021
·
OSTI ID:1872185
+9 more
Modeling and Assessment of Atomic Precision Advanced Manufacturing (APAM) Enabled Vertical Tunneling Field Effect Transistor.
Conference
·
2021
·
OSTI ID:1872185
+9 more
Current Paths in an Atomic Precision Advanced Manufactured Device Imaged by Nitrogen Vacancy Diamond Magnetic Microscopy.
Conference
·
2022
·
OSTI ID:1872185
+7 more