Sources and Mechanism of Degradation in p-Type Thiophene-Based Organic Electrochemical Transistors

Schafer, Emily A.; Wu, Ruiheng; Meli, Dilara; Tropp, Joshua; Moser, Maximilian; McCulloch, Iain; Paulsen, Bryan D.; Rivnay, Jonathan

doi:10.1021/acsaelm.1c01171

Sources and Mechanism of Degradation in p-Type Thiophene-Based Organic Electrochemical Transistors

Journal Article · 01 April 2022 · ACS Appl. Electron. Mater.

DOI:https://doi.org/10.1021/acsaelm.1c01171· OSTI ID:1871730

Schafer, Emily A.; Wu, Ruiheng; Meli, Dilara; Tropp, Joshua; Moser, Maximilian; McCulloch, Iain; Paulsen, Bryan D.; Rivnay, Jonathan

Research Organization:: Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)

Sponsoring Organization:: DOE - Office Of Science; NSF

OSTI ID:: 1871730

Journal Information:: ACS Appl. Electron. Mater., Journal Name: ACS Appl. Electron. Mater. Journal Issue: (4) Vol. 4

Country of Publication:: United States

Language:: ENGLISH

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