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Characterizing mid-circuit measurements with a new form of gate set tomography Part 1: Theory.

Conference ·
DOI:https://doi.org/10.2172/1855326· OSTI ID:1855326
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
IARPA
DOE Contract Number:
NA0003525;
OSTI ID:
1855326
Report Number(s):
SAND2021-2831C; 694685
Resource Type:
Conference presentation
Conference Information:
Proposed for presentation at the American Physical Society March Meeting held March 15-19, 2021.
Country of Publication:
United States
Language:
English