Extraction of Data-Driven Compact Models from High-Fidelity Semiconductor Simulations with Topological Data Analysis.
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- NA0003525
- OSTI ID:
- 1854316
- Report Number(s):
- SAND2021-2473C; 694449
- Resource Relation:
- Conference: Proposed for presentation at the SIAM Conference on Computional Science and Engineering 2021 held March 1-5, 2021 in Ft. Worth, Texas.
- Country of Publication:
- United States
- Language:
- English
Similar Records
Data-driven learning of nonlocal models: from high-fidelity simulations to constitutive laws.
Development and Demonstration of Data-driven Compact Device Models for Circuit Simulation and Analysis.
Data-driven learning of nonlocal physics from high-fidelity synthetic data.
Conference
·
2020
·
OSTI ID:1835229
+1 more
Development and Demonstration of Data-driven Compact Device Models for Circuit Simulation and Analysis.
Conference
·
2020
·
OSTI ID:1767901
Data-driven learning of nonlocal physics from high-fidelity synthetic data.
Conference
·
2021
·
OSTI ID:1888123