Imaging Dual-Moiré Lattices in Twisted Bilayer Graphene Aligned on Hexagonal Boron Nitride Using Microwave Impedance Microscopy

Huang, Xiong; Chen, Lingxiu; Tang, Shujie; Jiang, Chengxin; Chen, Chen; Wang, Huishan; Shen, Zhi-Xun; Wang, Haomin; Cui, Yong-Tao

doi:10.1021/acs.nanolett.1c00601

Title: Imaging Dual-Moiré Lattices in Twisted Bilayer Graphene Aligned on Hexagonal Boron Nitride Using Microwave Impedance Microscopy

Journal Article · Wed May 05 00:00:00 EDT 2021 · Nano Letters

DOI:https://doi.org/10.1021/acs.nanolett.1c00601· OSTI ID:1851730

^[1];

^[2]; Tang, Shujie ^[3]; Jiang, Chengxin ^[4]; Chen, Chen ^[4]; Wang, Huishan ^[4]; Shen, Zhi-Xun ^[5]; Wang, Haomin ^[4];

^[6]

Department of Physics and Astronomy, University of California, Riverside, California 92521, United States; Department of Materials Science and Engineering, University of California, Riverside, California 92521, United States
School of Materials Science and Physics, China University of Mining and Technology, Xuzhou 221116, China
2020 X-Lab, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
Department of Physics and Applied Physics, Geballe Laboratory for Advanced Materials, Stanford University, Stanford, California 94305, United States
Department of Physics and Astronomy, University of California, Riverside, California 92521, United States

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Research Organization:: Univ. of California, Riverside, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0012670

OSTI ID:: 1851730

Journal Information:: Nano Letters, Vol. 21, Issue 10; ISSN 1530-6984

Publisher:: American Chemical Society

Country of Publication:: United States

Language:: English

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Title: Imaging Dual-Moiré Lattices in Twisted Bilayer Graphene Aligned on Hexagonal Boron Nitride Using Microwave Impedance Microscopy

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