Nano-optical Imaging of In-Plane Homojunctions in Graphene and MoS 2 van der Waals Heterostructures on Talc and SiO 2

Gadelha, Andreij C.; Vasconcelos, Thiago L.; Cançado, Luiz G.; Jorio, Ado

doi:10.1021/acs.jpclett.1c01804

Nano-optical Imaging of In-Plane Homojunctions in Graphene and MoS ₂ van der Waals Heterostructures on Talc and SiO ₂

Journal Article · 05 August 2021 · Journal of Physical Chemistry Letters

DOI:https://doi.org/10.1021/acs.jpclett.1c01804· OSTI ID:1851154

^[1]; Vasconcelos, Thiago L. ^[2]; ^[3]; ^[4]

Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, MG 31270-901, Brazil; Department of Physics, Department of Chemistry, and JILA, University of Colorado at Boulder, Boulder, Colorado 80309, United States
Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, RJ 25250-020, Brazil
Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, MG 31270-901, Brazil
Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, MG 31270-901, Brazil; Electrical Engineering Graduate Program, Universidade Federal de Minas Gerais, Belo Horizonte, MG 31270-901, Brazil

Not provided.

Research Organization:: Univ. of Colorado, Boulder, CO (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0008807

OSTI ID:: 1851154

Journal Information:: Journal of Physical Chemistry Letters, Vol. 12, Issue 31; ISSN 1948-7185

Publisher:: American Chemical Society

Country of Publication:: United States

Language:: English

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