Optimizing Nonrigid Registration for Scanning Transmission Electron Microscopy Image Series

Zhang, Chenyu; Feng, Jie; Yankovich, Andrew B.; Kvit, Alexander; Berkels, Benjamin; Voyles, Paul M.

doi:10.1017/s1431927620024708

Optimizing Nonrigid Registration for Scanning Transmission Electron Microscopy Image Series

Journal Article · 23 November 2020 · Microscopy and Microanalysis

DOI:https://doi.org/10.1017/s1431927620024708· OSTI ID:1849894

Zhang, Chenyu ^[1]; Feng, Jie; Yankovich, Andrew B.; Kvit, Alexander; Berkels, Benjamin; Voyles, Paul M.

OSTI

Abstract

Research Organization:: Univ. of Wisconsin, Madison, WI (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: FG02-08ER46547;

OSTI ID:: 1849894

Journal Information:: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: 1 Vol. 27; ISSN 1431-9276

Publisher:: Microscopy Society of America (MSA)

Country of Publication:: United States

Language:: English

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