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Assessment of Energy Barriers Between ZrCuAlNi Amorphous Metal and Atomic Layer Deposition Insulators Using Internal Photoemission Spectroscopy
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journal
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January 2018 |
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Volt-current characteristics for tunneling through insulating films
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September 1962 |
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Enhanced low voltage nonlinearity in resonant tunneling metal–insulator–insulator–metal nanostructures
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November 2015 |
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Electrical properties of thin rf sputtered aluminum oxide films
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journal
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June 2004 |
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Optical rectification through an Al2O3 based MIM passive rectenna at 28.3 THz
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journal
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March 2018 |
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Engineering the current–voltage characteristics of metal–insulator–metal diodes using double-insulator tunnel barriers
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January 2012 |
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Interpretation of the Changing the Band Gap of Al 2 O 3 Depending on Its Crystalline Form: Connection with Different Local Symmetries
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journal
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August 2015 |
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Large Errors from Assuming Equivalent DC and High-Frequency Electrical Characteristics in Metal–Multiple-Insulator–Metal Diodes
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journal
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November 2018 |
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High-current density and high-asymmetry MIIM diode based on oxygen-non-stoichiometry controlled homointerface structure for optical rectenna
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December 2019 |
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Metal-dielectric band alignment and its implications for metal gate complementary metal-oxide-semiconductor technology
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December 2002 |
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Influence of stoichiometry on the dielectric properties of sputtered strontium titanate thin films
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September 2003 |
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Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating Film
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June 1963 |
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Potential Barriers and Emission‐Limited Current Flow Between Closely Spaced Parallel Metal Electrodes
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August 1964 |
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The MOM tunneling diode: Theoretical estimate of its performance at microwave and infrared frequencies
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October 1978 |
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Enhanced rectifying response from metal-insulator-insulator-metal junctions
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December 2011 |
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Observation of resonant tunneling phenomenon in metal-insulator-insulator-insulator-metal electron tunnel devices
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March 2012 |
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Step tunneling enhanced asymmetry in asymmetric electrode metal-insulator-insulator-metal tunnel diodes
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April 2013 |
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Investigation of the impact of insulator material on the performance of dissimilar electrode metal-insulator-metal diodes
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July 2014 |
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Enhancing metal-insulator-insulator-metal tunnel diodes via defect enhanced direct tunneling
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August 2014 |
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High performance MIIM diode based on cobalt oxide/titanium oxide
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journal
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May 2017 |
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Controlled modification of resonant tunneling in metal-insulator-insulator-metal structures
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January 2018 |
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Demonstration of distributed capacitance compensation in a metal-insulator-metal infrared rectenna incorporating a traveling-wave diode
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June 2019 |
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Photon detection in nonlinear tunneling devices
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October 1978 |
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Electron Emission in Intense Electric Fields
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May 1928 |
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Semiconductor core-level to valence-band maximum binding-energy differences: Precise determination by x-ray photoelectron spectroscopy
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August 1983 |
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Oxygen stoichiometry and instability in aluminum oxide tunnel barrier layers
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April 2005 |
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Mechanisms of current rectification in an STM tunnel junction and the measurement of an operational tunneling time
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January 1989 |
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Responsivity–Resistance Relationship in MIIM Diodes
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March 2018 |
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Performance Optimization of Antenna-Coupled ${\rm Al}/{\rm AlO}_{x}/{\rm Pt}$ Tunnel Diode Infrared Detectors
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January 2011 |
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Quantitative Comparison of Solid-State Microwave Detectors
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December 1966 |
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Rectennas Revisited
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November 2013 |
Thermal infrared detection using dipole antenna-coupled metal-oxide-metal diodes
- Bean, Jeffrey A.; Tiwari, Badri; Bernstein, Gary H.
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 27, Issue 1
https://doi.org/10.1116/1.3039684
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journal
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January 2009 |
Controlled etching and regrowth of tunnel oxide for antenna-coupled metal-oxide-metal diodes
- Tiwari, Badri; Bean, Jeffrey A.; Szakmány, Gergő
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 27, Issue 5
https://doi.org/10.1116/1.3204979
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journal
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January 2009 |
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Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride
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January 2012 |
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Efficient waveguide-integrated tunnel junction detectors at 1.6 μm
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journal
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January 2007 |
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Ellipsometry and XPS comparative studies of thermal and plasma enhanced atomic layer deposited Al 2 O 3 -films
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January 2013 |