Measuring qubit stability in a gate-based NISQ hardware processor

Yeter-Aydeniz, Kübra; Parks, Zachary; Thekkiniyedath, Aadithya Nair; Gustafson, Erik; Kemper, Alexander F.; Pooser, Raphael C.; Meurice, Yannick; Dreher, Patrick

doi:10.1007/s11128-023-03826-4

Measuring qubit stability in a gate-based NISQ hardware processor

Journal Article · 31 January 2023 · Quant.Inf.Proc.

DOI:https://doi.org/10.1007/s11128-023-03826-4· OSTI ID:1841391

Yeter-Aydeniz, Kübra ^[1]; Parks, Zachary ^[2]; Thekkiniyedath, Aadithya Nair ^[2]; Gustafson, Erik ^[3]; Kemper, Alexander F. ^[2]; Pooser, Raphael C. ^[4]; Meurice, Yannick ^[5]; ^[2]

Oak Ridge; SAIC, McLean
North Carolina State U.
Fermilab; Iowa U.
Oak Ridge
Iowa U.

Some of the most problematic issues that limit the implementation of applications on Noisy Intermediate Scale Quantum (NISQ) machines are the adverse impacts of both incoherent and coherent errors. We conducted an in-depth study of coherent errors on a quantum hardware platform using a transverse field Ising model Hamiltonian as a sample user application. We report here on the results from these computations using several error mitigation protocols that profile these errors and provide an indication of the hardware qubit stability. Through a detailed set of measurements we identify inter-day and intra-day qubit calibration drift and the impacts of quantum circuit placement on groups of qubits in different physical locations on the processor. This paper also discusses how these measurements can provide a better understanding of these types of errors and how they may improve efforts to validate the accuracy of quantum computations.

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Research Organization:: Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), High Energy Physics (HEP)

DOE Contract Number:: AC02-07CH11359

OSTI ID:: 1841391

Report Number(s):: FERMILAB-PUB-22-024-T; arXiv:2201.02899; oai:inspirehep.net:2007076

Journal Information:: Quant.Inf.Proc., Vol. 22, Issue 2

Country of Publication:: United States

Language:: English

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