Multispectral impedance determination under dynamic load conditions

Christophersen, Jon P.; Morrison, John L.; Morrison, William H.

Multispectral impedance determination under dynamic load conditions

Patent · 06 July 2021

OSTI ID:1840234

Christophersen, Jon P.; Morrison, John L.; Morrison, William H.

Impedance testing devices, circuits, systems, and related methods are disclosed. A Device Under Test (DUT) is excited with a multispectral excitation signal for an excitation time period while the DUT is under a load condition from a load operably coupled to the DUT. A response of the DUT is sampled over a sample time period. The sample time period is configured such that it includes an in-band interval during the excitation time period and one or more out-of-band intervals outside of the in-band interval. A response of the DUT to the load condition during the in-band interval is estimated by analyzing samples of the response from the one or more out-of-band intervals. Adjusted samples are computed by subtracting the estimated load response during the in-band interval from the samples from the in-band interval. An impedance of the DUT is estimated by analyzing the adjusted samples.

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Research Organization:: Idaho National Laboratory (INL), Idaho Falls, ID (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC07-05ID14517

Assignee:: Battelle Energy Alliance, LLC (Idaho Falls, ID)

Patent Number(s):: 11,054,481

Application Number:: 16/357,865

OSTI ID:: 1840234

Country of Publication:: United States

Language:: English

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