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Optical lithography

Book ·

Optical lithography is a photon-based technique comprised of projecting an image into a photosensitive emulsion (photoresist) coated onto a substrate such as a silicon wafer. It is the most widely used lithography process in the high volume manufacturing of nano-electronics by the semiconductor industry. Optical lithography’s ubiquitous use is a direct result of its highly parallel nature allowing vast amounts of information to be transferred very rapidly. For example, a modern leading edge lithography tool produces 150-300-mm patterned wafers per hour with 40-nm two-dimensional pattern resolution, yielding a pixel throughput of approximately 1.8T pixels/s. Continual advances in optical lithography capabilities have enabled the computing revolution over the past 50 years.

Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
DOE Contract Number:
AC02-05CH11231
OSTI ID:
1835561
Resource Relation:
Related Information: Book Title: Comprehensive Nanoscience and Nanotechnology
Country of Publication:
United States
Language:
English

References (26)

Optical projection lithography using lenses with numerical apertures greater than unity journal May 1989
Immersion lithography; its potential performance and issues conference June 2003
Material design for immersion lithography with high refractive index fluid (HIF) conference May 2005
Zone-plate array lithography (ZPAL): a new maskless approach conference June 1999
Liquid immersion deep-ultraviolet interferometric lithography
  • Hoffnagle, J. A.; Hinsberg, W. D.; Sanchez, M.
  • Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 17, Issue 6 https://doi.org/10.1116/1.591000
journal January 1999
A spacer patterning technology for nanoscale CMOS journal March 2002
Catadioptric lens development for DUV and VUV projection optics conference June 2003
Four-mirror imaging system (magnification +1/5) for ArF excimer laser lithography journal May 1995
Excimer laser photolithography with a 1:1 broadband catadioptric optics conference July 1991
Layered synthetic microstructures as Bragg diffractors for X rays and extreme ultraviolet: theory and predicted performance journal January 1981
Performance of 250W high-power HVM LPP-EUV source conference March 2017
Debris mitigation in a laser-produced tin plume using a magnetic field journal August 2005
Properties of ion debris emitted from laser-produced mass-limited tin plasmas for extreme ultraviolet light source applications journal December 2005
Spectroscopic study of debris mitigation with minimum-mass Sn laser plasma for extreme ultraviolet lithography journal April 2006
Origins of debris and mitigation through a secondary RF plasma system for discharge-produced EUV sources journal February 2005
Ion debris characterization from a z-pinch extreme ultraviolet light source journal March 2006
Continuing Moore's law with EUV lithography conference December 2017
Atomic Hydrogen Cleaning of Surface Ru Oxide Formed by Extreme Ultraviolet Irradiation of Ru-Capped Multilayer Mirrors in H2O Ambience journal June 2007
Layout compensation for EUV flare conference May 2005
First performance results of the ASML alpha demo tool conference March 2006
EUV progress toward HVM readiness conference March 2016
Progress in EUV lithography toward manufacturing conference March 2017
EUV Lithography: From the Very Beginning to the Eve of Manufacturing conference March 2016
EUV patterning successes and frontiers conference March 2016
Improved contrast and reflectivity of multilayer reflective optics for wavelengths beyond the extreme UV conference March 2009
Update on the SEMATECH 0.5 NA Extreme-Ultraviolet Lithography (EUVL) Microfield Exposure Tool (MET) conference April 2014

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