X-ray spectrometer

Patent · 09 February 2021

OSTI ID:1805495

Ullom, Joel; O'Neil, Glen Daniel; Avila, Luis Miguel; Silverman, Kim Ernest Alexander; Swetz, Daniel; Jimenez, Ralph; Doriese, William Bertrand; Hilton, Gene; Reintsema, Carl; Schmidt, Daniel; Alpert, Bradley K.; Uhlig, Jens; Joe, Young; Fullagar, Wilfred K.; Sundstrom, Villy; Maasilta, Ilari; Fowler, Joseph A.

An x-ray spectrometer includes: an x-ray plasma source that produces first x-rays; an x-ray optic in optical communication with the x-ray plasma source and that: receives the first x-rays from the x-ray plasma source; focuses the first x-rays to produce second x-rays; and communicates the second x-rays to a sample that produces product x-rays in response to receipt of the second x-rays and second light; and a microcalorimeter array detector in optical communication with the sample and that receives the product x-rays from the sample.

• Research Organization: National Institute of Standards and Technology (NIST), Gaithersburg, MD (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES); US Dept. of Commerce
• Other Award/Contract Number: 16480-A4001
• Assignee: Government of the United States of America, as represented by the Secretary of Commerce (Gaithersburg, MD)
• Patent Number(s): 10,914,694
• Application Number: 15/865,992
• OSTI ID: 1805495
• Country of Publication: United States
• Language: English