Amorphous to Crystal Phase Change Memory Effect with Two-Fold Bandgap Difference in Semiconducting K
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Sponsoring Organization:
- DOE - Office Of Science; National Science Foundation (NSF)
- OSTI ID:
- 1784980
- Journal Information:
- J. Am. Chem. Soc., Vol. 143, Issue (16)
- Country of Publication:
- United States
- Language:
- ENGLISH
Similar Records
Amorphous to Crystal Phase Change Memory Effect with Two-Fold Bandgap Difference in Semiconducting K
Effects of germanium and nitrogen incorporation on crystallization of N-doped Ge{sub 2+x}Sb{sub 2}Te{sub 5} (x = 0,1) thin films for phase-change memory
Pressure-induced reversible amorphization and an amorphous-amorphous transition in Ge2Sb2Te5 phase-change memory material
Journal Article
·
2021
· J. Am. Chem. Soc.
·
OSTI ID:1787778
+10 more
Effects of germanium and nitrogen incorporation on crystallization of N-doped Ge{sub 2+x}Sb{sub 2}Te{sub 5} (x = 0,1) thin films for phase-change memory
Journal Article
·
2013
· Journal of Applied Physics
·
OSTI ID:22102248
+5 more
Pressure-induced reversible amorphization and an amorphous-amorphous transition in Ge2Sb2Te5 phase-change memory material
Journal Article
·
2011
· Proceedings of the National Academy of Sciences of the United States of America
·
OSTI ID:1383779
+3 more