Determination of Hafnium Zirconium Oxide Interfacial Band Alignments Using Internal Photoemission Spectroscopy and X-ray Photoelectron Spectroscopy

Jenkins, M; Holden, K.; Smith, S.; Brumbach, M.; Henry, M.; Weiland, C.; Woicik, J.; Jaszewski, S.; Ihlefeld, J.; Conley, J.

doi:10.1021/acsami.0c17729

Title: Determination of Hafnium Zirconium Oxide Interfacial Band Alignments Using Internal Photoemission Spectroscopy and X-ray Photoelectron Spectroscopy

Journal Article · 01 January 2022 · ACS Applied Materials and Interfaces

DOI:https://doi.org/10.1021/acsami.0c17729· OSTI ID:1783984

Jenkins, M; Holden, K.; Smith, S.; Brumbach, M.; Henry, M.; Weiland, C.; Woicik, J.; Jaszewski, S.; Ihlefeld, J.; Conley, J.

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Research Organization:: Brookhaven National Lab. (BNL), Upton, NY (United States)

Sponsoring Organization:: ~OTHER

DOE Contract Number:: SC0012704

OSTI ID:: 1783984

Report Number(s):: BNL-221515-2021-JACI

Journal Information:: ACS Applied Materials and Interfaces, Vol. 13, Issue 12

Country of Publication:: United States

Language:: English

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