A NIST facility for resonant soft x-ray scattering measuring nano-scale soft matter structure at NSLS-II

Gann, E; Crofts, T.; Holland, G.; Beaucage, P.; McAfee, T.; Kline, R.; Collins, B.; McNeill, C.; Fischer, D.; DeLongchamp, D.

doi:10.1088/1361-648X/abdffb

A NIST facility for resonant soft x-ray scattering measuring nano-scale soft matter structure at NSLS-II

Journal Article · 01 January 2022 · Journal of Physics. Condensed Matter

DOI:https://doi.org/10.1088/1361-648X/abdffb· OSTI ID:1783977

Gann, E; Crofts, T.; Holland, G.; Beaucage, P.; McAfee, T.; Kline, R.; Collins, B.; McNeill, C.; Fischer, D.; DeLongchamp, D.

Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: ~OTHER

DOE Contract Number:: SC0012704

OSTI ID:: 1783977

Report Number(s):: BNL-221508-2021-JACI

Journal Information:: Journal of Physics. Condensed Matter, Vol. 33, Issue 16

Country of Publication:: United States

Language:: English

References (18)

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NIST NSLS-II spectroscopy beamline optical plan for soft and tender X-ray spectroscopy and microscopy (100eV to 7.5keV) Reininger, R.; Woicik, J. C.; Hulbert, S. L. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 649, Issue 1 https://doi.org/10.1016/j.nima.2010.11.172	journal	September 2011
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