Resonance ionization mass spectrometry (RIMS): Fundamentals and applications including secondary neutral mass spectrometry

Title: Resonance ionization mass spectrometry (RIMS): Fundamentals and applications including secondary neutral mass spectrometry

Full Record
Other Related Research

Authors:

Savina, M R ^[1]; Trappitsch, R G ^[1]

Lawrence Livermore National Laboratory

Publication Date:: 2021-01-01

Research Org.:: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Sponsoring Org.:: USDOE National Nuclear Security Administration (NNSA)

OSTI Identifier:: 1763939

Report Number(s):: LLNL-BOOK-765159
955088

DOE Contract Number:: AC52-07NA27344

Resource Type:: Book

Country of Publication:: United States

Language:: English

Subject:: Physics - Atomic and molecular physics, Lasers, Chemistry - Inorganic, organic, physical and analytical chemistry, Chemistry - Isotopes and radiation sources

Citation Formats


                    Savina, M R, and Trappitsch, R G. Resonance ionization mass spectrometry (RIMS): Fundamentals and applications including secondary neutral mass spectrometry.  United States: N. p., 2021. 
        Web.

Copy to clipboard


                    Savina, M R, & Trappitsch, R G. Resonance ionization mass spectrometry (RIMS): Fundamentals and applications including secondary neutral mass spectrometry.  United States.

Copy to clipboard


                    Savina, M R, and Trappitsch, R G. Fri .  
        "Resonance ionization mass spectrometry (RIMS): Fundamentals and applications including secondary neutral mass spectrometry".  United States.  https://www.osti.gov/servlets/purl/1763939.

Copy to clipboard


                    
@article{osti_1763939,

  title        = {Resonance ionization mass spectrometry (RIMS): Fundamentals and applications including secondary neutral mass spectrometry},

  author       = {Savina, M R and Trappitsch, R G},

  abstractNote = {},

  doi          = {},

  url          = {https://www.osti.gov/biblio/1763939},
  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2021},

  month        = {1}

}

Copy to clipboard

Book:

View Book (3.52 MB)

Other availability

Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this book.

Save / Share:

Export Metadata

Save to My Library

Similar records in OSTI.GOV collections:

Resonance enhanced multiphoton ionization/secondary neutral mass spectrometry and cesium attachment secondary ion mass spectrometry of bronze : a comparison.

Journal Article McCann, M P ; Calaway, W F ; Pellin, M J ; ... - Surf. Interface Anal.

Archaeologists have considerable interests in ancient bronzes. They want to know how these alloys were produced and how they corroded with time. Modern bronzes, with compositions very close to that of some ancient bronzes, have been produced and two methods were examined to characterize one of these modern bronzes. Analysis of this modern bronze using resonance enhanced multiphoton ionization/secondary neutral mass spectrometry (REMPI/SNMS) is examined in detail and compared to cesium attachment secondary ion mass spectrometry (CsAMS) results. Both REMPI/SNMS and CsAMS were used to quantify the composition of Fe, Ni and Mn in a modern quaternary bronze designed tomore »« less
https://doi.org/10.1002/sia.1222
Secondary ion mass spectrometry: basic concepts, instrumental aspects, applications and trends

Book Benninghoven, A ; Rudenauer, F G ; Werner, H W

In their preface, the authors note that no comprehensive treatment of secondary-ion mass spectrometry exists and that this book was written to correct the omission. Drawing on a total of over 75 years of experience with the method, these three authors have assembled a monumental work that belongs on the desk of every mass spectroscopist and every surface scientist. After a brief introductory chapter, the second chapter provides an extensive review of the ion-solid interactions, beginning with processes induced in the solid target by energetic primary ion impact, including discussions of ion stopping powers, ion trajectories, and damage and mixingmore »« less
Secondary neutral mass spectrometry using three-color resonance ionization: Osmium detection at the p. p. b. level and iron detection in silicon at the lt 200 p. p. t. level

Journal Article Pellin, M J ; Young, C E ; Calaway, W F ; ... - Philosophical Transactions of the Royal Society of London. Series A, Physical Sciences and Engineering; (United Kingdom)

The authors have demonstrated the ability of three-color resonant SNMS to detect and separate Os and Re in Ni samples at the 4 p.p.b. level. In situ analysis of Os in iron meteorites demonstrates an elemental selectivity of Os over Re of greater than 10{sup 3} without prior chemical separation. Measurements on a suite of samples with Os concentration varying from 10% down to 100 p.p.b. show a linear correlation between concentration and signal with a precision of better than {plus minus}13% and a useful yield in excess of 1%. Iron impurity atoms form deep level traps in Si, changingmore »« less
https://doi.org/10.1098/rsta.1990.0143
Secondary neutral mass spectrometry using three-color resonance ionization: Os detection at the ppb level and Fe detection in Si at the 40 ppt level

Conference Pellin, M J ; Young, C E ; Calaway, W F ; ...

Among the many uses of resonantly enhanced multiphoton ionization (REMPI) spectroscopy, secondary neutral mass spectrometry (SNMS) is both one of the most demanding and one of the most important. Recently, we have demonstrated that the selectivity of REMPI, and thus the sensitivity of SNMS, can be greatly enhanced using resonant excitation schemes involving multiply resonant processes. Of particular interest, is the use of autoionizing resonances, resonances with energies in excess of the ionization potential of the atom, in the REMPI process. The use of autoionizing resonances can reduce the laser intensity required to saturate the ionization process by more thanmore »« less
Secondary Neutral Mass Spectrometry: The application of laser post ionization to trace surface analysis in semiconductor materials. [Fe on O-implanted Si]

Conference Pellin, M J ; Young, C E ; Calaway, W F ; ...

SNMS uses the secondary neutral sputtered fraction, and can increase both yield and quantitative analysis. In this paper, lasers are used to ionize and then detect the sputtered neutral particles. This method is used with oxygen ion implantation to study Fe on Si substrates. In this way, Fe could be detected at the 500 ppT level in a single monolayer. 34 refs., 6 figs. (DLC)
Full Text Available

Similar Records