Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

Levine, A; Bu, G.; Biswas, S.; Tsai, E.; Braunschweig, A.; Nannenga, B.

doi:10.1039/d0cc00119h

Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

Journal Article · 31 December 2021 · ChemComm

DOI:https://doi.org/10.1039/d0cc00119h· OSTI ID:1690034

Levine, A; Bu, G.; Biswas, S.; Tsai, E.; Braunschweig, A.; Nannenga, B.

Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: ~OTHER

DOE Contract Number:: SC0012704

OSTI ID:: 1690034

Report Number(s):: BNL-220362-2020-JACI

Journal Information:: ChemComm, Journal Name: ChemComm Journal Issue: 30 Vol. 56; ISSN 1359-7345

Country of Publication:: United States

Language:: English

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Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

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