Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

Levine, A; Bu, G.; Biswas, S.; Tsai, E.; Braunschweig, A.; Nannenga, B.

doi:10.1039/d0cc00119h

Title: Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

Journal Article · 01 January 2022 · ChemComm

DOI:https://doi.org/10.1039/d0cc00119h· OSTI ID:1690034

Levine, A; Bu, G.; Biswas, S.; Tsai, E.; Braunschweig, A.; Nannenga, B.

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Research Organization:: Brookhaven National Lab. (BNL), Upton, NY (United States)

Sponsoring Organization:: ~OTHER

DOE Contract Number:: SC0012704

OSTI ID:: 1690034

Report Number(s):: BNL-220362-2020-JACI

Journal Information:: ChemComm, Vol. 56, Issue 30

Country of Publication:: United States

Language:: English

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CCDC 1963919: Experimental Crystal Structure Determination M., Levine, Andrew; Guanhong, Bu,; Sankarsan, Biswas, https://doi.org/10.5517/ccdc.csd.cc23xm7x The current record is supplemented by this dataset	dataset	January 2020
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Title: Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

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