Absolute measurement of the Fano factor using a Skipper-CCD

Title: Absolute measurement of the Fano factor using a Skipper-CCD

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Abstract

Skipper-CCD can achieve deep sub-electron readout noise making possible the absolute determination of the exact number of ionized electrons in a large range, from 0 to above 1900 electrons. In this work we present a novel technique that exploits this unique capability to allow self-calibration and the ultimate determination of silicon properties. We performed an absolute measurement of the variance and the mean number of the charge distribution produced by $$^{55}$$Fe X-rays, getting a Fano factor absolute measurement in Si at 123K and 5.9 keV. A value of 0.119 $$\pm$$ 0.002 was found and the electron-hole pair creation energy was determined to be (3.749 $$\pm$$ 0.001) eV. This technology opens the opportunity for direct measurements of the Fano factor at low energies.

Authors:

Rodrigues, Dario ^[1]; Andersson, Kevin ^[1]; Cababie, Mariano ^[1]; Donadon, Andre ^[1]; Cancelo, Gustavo ^[1]; Estrada, Juan ^[1]; Fernandez-Moroni, Guillermo ^[1]; Piegaia, Ricardo ^[2]; Senger, Matias ^[1]; Sofo Haro, Miguel ^[3]; Stefanazzi, Leandro ^[1]; Tiffenberg, Javier ^[1]; Uemura, Sho ^[4]

Fermilab
Buenos Aires, CONICET
Centro Atomico Bariloche
Tel Aviv U.

Publication Date:: 2020-04-23

Research Org.:: Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)

Sponsoring Org.:: USDOE Office of Science (SC), High Energy Physics (HEP)

OSTI Identifier:: 1682295

Report Number(s):: arXiv:2004.11499; FERMILAB-PUB-20-283-E
oai:inspirehep.net:1792791

DOE Contract Number:: AC02-07CH11359

Resource Type:: Journal Article

Journal Name:: TBD

Additional Journal Information:: Journal Name: TBD

Country of Publication:: United States

Language:: English

Subject:: 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats


                    Rodrigues, Dario, Andersson, Kevin, Cababie, Mariano, Donadon, Andre, Cancelo, Gustavo, Estrada, Juan, Fernandez-Moroni, Guillermo, Piegaia, Ricardo, Senger, Matias, Sofo Haro, Miguel, Stefanazzi, Leandro, Tiffenberg, Javier, and Uemura, Sho. Absolute measurement of the Fano factor using a Skipper-CCD.  United States: N. p., 2020. 
        Web.

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                    Rodrigues, Dario, Andersson, Kevin, Cababie, Mariano, Donadon, Andre, Cancelo, Gustavo, Estrada, Juan, Fernandez-Moroni, Guillermo, Piegaia, Ricardo, Senger, Matias, Sofo Haro, Miguel, Stefanazzi, Leandro, Tiffenberg, Javier, & Uemura, Sho. Absolute measurement of the Fano factor using a Skipper-CCD.  United States.

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                    Rodrigues, Dario, Andersson, Kevin, Cababie, Mariano, Donadon, Andre, Cancelo, Gustavo, Estrada, Juan, Fernandez-Moroni, Guillermo, Piegaia, Ricardo, Senger, Matias, Sofo Haro, Miguel, Stefanazzi, Leandro, Tiffenberg, Javier, and Uemura, Sho. Thu .  
        "Absolute measurement of the Fano factor using a Skipper-CCD".  United States.  https://www.osti.gov/servlets/purl/1682295.

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@article{osti_1682295,

  title        = {Absolute measurement of the Fano factor using a Skipper-CCD},

  author       = {Rodrigues, Dario and Andersson, Kevin and Cababie, Mariano and Donadon, Andre and Cancelo, Gustavo and Estrada, Juan and Fernandez-Moroni, Guillermo and Piegaia, Ricardo and Senger, Matias and Sofo Haro, Miguel and Stefanazzi, Leandro and Tiffenberg, Javier and Uemura, Sho},

  abstractNote = {Skipper-CCD can achieve deep sub-electron readout noise making possible the absolute determination of the exact number of ionized electrons in a large range, from 0 to above 1900 electrons. In this work we present a novel technique that exploits this unique capability to allow self-calibration and the ultimate determination of silicon properties. We performed an absolute measurement of the variance and the mean number of the charge distribution produced by $^{55}$Fe X-rays, getting a Fano factor absolute measurement in Si at 123K and 5.9 keV. A value of 0.119 $\pm$ 0.002 was found and the electron-hole pair creation energy was determined to be (3.749 $\pm$ 0.001) eV. This technology opens the opportunity for direct measurements of the Fano factor at low energies.},

  doi          = {},

  url          = {https://www.osti.gov/biblio/1682295},
  journal      = {TBD},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2020},

  month        = {4}

}

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