speckle-tracking : a software suite for ptychographic X-ray speckle tracking

Journal Article · Mon Oct 19 00:00:00 EDT 2020 · Journal of Applied Crystallography (Online)

DOI:https://doi.org/10.1107/S1600576720011991· OSTI ID:1678768

Morgan, Andrew J.; Murray, Kevin T.; Quiney, Harry M.; Bajt, Saša; Chapman, Henry N.

In recent years, X-ray speckle-tracking techniques have emerged as viable tools for wavefront metrology and sample imaging applications. These methods are based on the measurement of near-field images. Thanks to their simple experimental setup, high angular sensitivity and compatibility with low-coherence sources, these methods have been actively developed for use with synchrotron and laboratory light sources. Not only do speckle-tracking techniques give the potential for high-resolution imaging, but they also provide rapid and robust characterization of aberrations of X-ray optical elements, focal spot profiles, and sample position and transmission properties. In order to realize these capabilities, software implementations are required that are equally rapid and robust. To address this need, a software suite has been developed for the ptychographic X-ray speckle-tracking technique, an X-ray speckle-based method suitable for highly divergent wavefields. The software suite is written in Python 3, with an OpenCL back end for GPU and multi-CPU core processing. It is accessible as a Python module, through the command line or through a graphical user interface, and is available as source code under Version 3 or later of the GNU General Public License.

• Sponsoring Organization: USDOE
• OSTI ID: 1678768
• Journal Information: Journal of Applied Crystallography (Online), Journal Name: Journal of Applied Crystallography (Online) Vol. 53 Journal Issue: 6; ISSN 1600-5767
• Publisher: International Union of Crystallography (IUCr)
• Country of Publication: Denmark
• Language: English