Methods for In Situ Electroluminescence Imaging of Photovoltaic Modules Under Varying Environmental Conditions

Owen-Bellini, Michael; Sulas-Kern, Dana B.; Perrin, Greg; North, Hannah; Spataru, Sergiu; Hacke, Peter

doi:10.1109/jphotov.2020.3001723

Title: Methods for In Situ Electroluminescence Imaging of Photovoltaic Modules Under Varying Environmental Conditions

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Abstract

Electroluminescence (EL) imaging is a powerful tool used to identify defects in photovoltaic solar cells. Typically, this type of characterization is performed in the dark using a current injection that equals short-circuit current measured at standard test conditions (STC). Restricting imaging to such a temperature range limits the information obtained about the module and cells. However, it is not trivial to develop a tool that would allow for EL imaging to be performed under a wider range of temperatures. Here we demonstrate an in situ EL imaging capability developed within an environmental chamber that allows for control of sample temperatures between –40 and 90 °C. Additionally, we demonstrate EL imaging of 4-cell mini-modules (MiMo) under front-side mechanical loading. A Raspberry Pi-connected camera with short-pass filter removed is used for EL imaging. The camera is low-cost with a small form-factor, appropriate for use in a harsh, enclosed environment. The camera is installed within a thermally isolating housing mounted within the environmental chamber. Three example cases are given for MiMos that exhibit various forms of degradation including solder fatigue and cell cracking. It is shown that by measuring at conditions above and below STC, different behaviors may be identified. In some cases,more »« less

Authors:

^[1];

^[1]; Perrin, Greg ^[2]; North, Hannah ^[1];

^[2];

^[1]

National Renewable Energy Lab. (NREL), Golden, CO (United States)
Technical Univ. of Denmark, Roskilde (Denmark)

Publication Date:: 2020-06-22

Research Org.:: National Renewable Energy Lab. (NREL), Golden, CO (United States)

Sponsoring Org.:: USDOE Office of Energy Efficiency and Renewable Energy (EERE)

OSTI Identifier:: 1665871

Report Number(s):: NREL/JA-5K00-76361
Journal ID: ISSN 2156-3381; MainId:7091;UUID:f20f6bcf-5465-ea11-9c31-ac162d87dfe5;MainAdminID:18548

Grant/Contract Number:: AC36-08GO28308

Resource Type:: Journal Article: Accepted Manuscript

Journal Name:: IEEE Journal of Photovoltaics

Additional Journal Information:: Journal Volume: 10; Journal Issue: 5; Journal ID: ISSN 2156-3381

Publisher:: IEEE

Country of Publication:: United States

Language:: English

Subject:: 14 SOLAR ENERGY; combined-accelerated stress testing; DuraMAT; electroluminescence; module characterization

Citation Formats


                    Owen-Bellini, Michael, Sulas-Kern, Dana B., Perrin, Greg, North, Hannah, Spataru, Sergiu, and Hacke, Peter. Methods for In Situ Electroluminescence Imaging of Photovoltaic Modules Under Varying Environmental Conditions.  United States: N. p., 2020. 
        Web.  doi:10.1109/jphotov.2020.3001723.

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                    Owen-Bellini, Michael, Sulas-Kern, Dana B., Perrin, Greg, North, Hannah, Spataru, Sergiu, & Hacke, Peter. Methods for In Situ Electroluminescence Imaging of Photovoltaic Modules Under Varying Environmental Conditions.  United States.  https://doi.org/10.1109/jphotov.2020.3001723

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                    Owen-Bellini, Michael, Sulas-Kern, Dana B., Perrin, Greg, North, Hannah, Spataru, Sergiu, and Hacke, Peter. 2020.  
        "Methods for In Situ Electroluminescence Imaging of Photovoltaic Modules Under Varying Environmental Conditions".  United States.  https://doi.org/10.1109/jphotov.2020.3001723.  https://www.osti.gov/servlets/purl/1665871.

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@article{osti_1665871,

  title        = {Methods for In Situ Electroluminescence Imaging of Photovoltaic Modules Under Varying Environmental Conditions},

  author       = {Owen-Bellini, Michael and Sulas-Kern, Dana B. and Perrin, Greg and North, Hannah and Spataru, Sergiu and Hacke, Peter},

  abstractNote = {Electroluminescence (EL) imaging is a powerful tool used to identify defects in photovoltaic solar cells. Typically, this type of characterization is performed in the dark using a current injection that equals short-circuit current measured at standard test conditions (STC). Restricting imaging to such a temperature range limits the information obtained about the module and cells. However, it is not trivial to develop a tool that would allow for EL imaging to be performed under a wider range of temperatures. Here we demonstrate an in situ EL imaging capability developed within an environmental chamber that allows for control of sample temperatures between –40 and 90 °C. Additionally, we demonstrate EL imaging of 4-cell mini-modules (MiMo) under front-side mechanical loading. A Raspberry Pi-connected camera with short-pass filter removed is used for EL imaging. The camera is low-cost with a small form-factor, appropriate for use in a harsh, enclosed environment. The camera is installed within a thermally isolating housing mounted within the environmental chamber. Three example cases are given for MiMos that exhibit various forms of degradation including solder fatigue and cell cracking. It is shown that by measuring at conditions above and below STC, different behaviors may be identified. In some cases, restricting characterization to STC may lead to a failure to detect damage existing in the sample.},

  doi          = {10.1109/jphotov.2020.3001723},

  url          = {https://www.osti.gov/biblio/1665871},
  journal      = {IEEE Journal of Photovoltaics},

  issn         = {2156-3381},

  number       = 5,

  volume       = 10,

  place        = {United States},

  year         = {2020},

  month        = {6}

}

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