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Title: X-ray topographic study of Bridgman-grown CdZnTeSe

Abstract

We have characterized the structural quality of Cd 0.9Zn 0.1Te 0.93Se 0.07 ingot grown by the vertical Bridgman growth technique. The structural quality of Cd 0.9Zn 0.1Te 0.93Se 0.07 ingot along the length was investigated via X-ray topography in the reflection mode using a white beam synchrotron radiation source. The X-ray topography data revealed the presence of very few sub grain boundaries and no sub-grain boundary network for the CdZnTeSe samples used in this study.

Authors:
 [1];  [1];  [1];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Savannah River Site (SRS), Aiken, SC (United States); Savannah River National Lab (SRNL), Aiken, SC (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA), Office of Defense Nuclear Nonproliferation; USDOE Office of Electricity (OE), Advanced Grid Research & Development. Power Systems Engineering Research
OSTI Identifier:
1638474
Alternate Identifier(s):
OSTI ID: 1635406
Report Number(s):
SRNL-STI-2019-00515
Journal ID: ISSN 0022-0248
Grant/Contract Number:  
AC09-08SR22470; SC0012704
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Crystal Growth
Additional Journal Information:
Journal Volume: 546; Journal Issue: C; Journal ID: ISSN 0022-0248
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Roy, Utpal N., Camarda, Giuseppe S., Cui, Yonggang, and James, Ralph B. X-ray topographic study of Bridgman-grown CdZnTeSe. United States: N. p., 2020. Web. doi:10.1016/j.jcrysgro.2020.125753.
Roy, Utpal N., Camarda, Giuseppe S., Cui, Yonggang, & James, Ralph B. X-ray topographic study of Bridgman-grown CdZnTeSe. United States. https://doi.org/10.1016/j.jcrysgro.2020.125753
Roy, Utpal N., Camarda, Giuseppe S., Cui, Yonggang, and James, Ralph B. Mon . "X-ray topographic study of Bridgman-grown CdZnTeSe". United States. https://doi.org/10.1016/j.jcrysgro.2020.125753.
@article{osti_1638474,
title = {X-ray topographic study of Bridgman-grown CdZnTeSe},
author = {Roy, Utpal N. and Camarda, Giuseppe S. and Cui, Yonggang and James, Ralph B.},
abstractNote = {We have characterized the structural quality of Cd0.9Zn0.1Te0.93Se0.07 ingot grown by the vertical Bridgman growth technique. The structural quality of Cd0.9Zn0.1Te0.93Se0.07 ingot along the length was investigated via X-ray topography in the reflection mode using a white beam synchrotron radiation source. The X-ray topography data revealed the presence of very few sub grain boundaries and no sub-grain boundary network for the CdZnTeSe samples used in this study.},
doi = {10.1016/j.jcrysgro.2020.125753},
url = {https://www.osti.gov/biblio/1638474}, journal = {Journal of Crystal Growth},
issn = {0022-0248},
number = C,
volume = 546,
place = {United States},
year = {2020},
month = {6}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on June 8, 2021
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