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Title: Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens

Abstract

Digital camera-based neutron imaging systems consisting of a neutron scintillator screen optically coupled to a digital camera are the most common digital neutron imaging system used in the neutron imaging community and are available at any state-of-the-art imaging facility world-wide. Neutron scintillator screens are the integral component of these imaging system that directly interacts with the neutron beam and dictates the neutron capture efficiency and image quality limitations of the imaging system. This work describes a novel approach for testing neutron scintillators that provides a simple and efficient way to measure relative light yield and detection efficiency over a range of scintillator thicknesses using a single scintillator screen and only a few radiographs. Additionally, two methods for correlating the screen thickness to the measured data were implemented and compared. An example 6LiF:ZnS scintillator screen with nominal thicknesses ranging from 0–300 μm was used to demonstrate this approach. The multi-thickness screen and image and data processing methods are not exclusive to neutron scintillator screens but could be applied to X-ray imaging as well. This approach has the potential to benefit the entire radiographic imaging community by offering an efficient path forward for manufacturers to develop higher-performance scintillators and for imaging facilitiesmore » and service providers to determine the optimal screen parameters for their particular beam and imaging system.« less

Authors:
;
Publication Date:
Research Org.:
Idaho National Lab. (INL), Idaho Falls, ID (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
OSTI Identifier:
1635298
Alternate Identifier(s):
OSTI ID: 1635528
Report Number(s):
INL/JOU-20-58131-Rev001
Journal ID: ISSN 2313-433X; PII: jimaging6070056
Grant/Contract Number:  
AC07-05ID14517; 20A44-200FP
Resource Type:
Journal Article: Published Article
Journal Name:
Journal of Imaging
Additional Journal Information:
Journal Name: Journal of Imaging Journal Volume: 6 Journal Issue: 7; Journal ID: ISSN 2313-433X
Publisher:
MDPI
Country of Publication:
Switzerland
Language:
English
Subject:
42 ENGINEERING; Neutron; Imaging; Radiography; Digital Imaging; Scintillator Development; Scintillator Screen

Citation Formats

Chuirazzi, William C., and Craft, Aaron E. Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens. Switzerland: N. p., 2020. Web. doi:10.3390/jimaging6070056.
Chuirazzi, William C., & Craft, Aaron E. Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens. Switzerland. doi:10.3390/jimaging6070056.
Chuirazzi, William C., and Craft, Aaron E. Mon . "Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens". Switzerland. doi:10.3390/jimaging6070056.
@article{osti_1635298,
title = {Measuring Thickness-Dependent Relative Light Yield and Detection Efficiency of Scintillator Screens},
author = {Chuirazzi, William C. and Craft, Aaron E.},
abstractNote = {Digital camera-based neutron imaging systems consisting of a neutron scintillator screen optically coupled to a digital camera are the most common digital neutron imaging system used in the neutron imaging community and are available at any state-of-the-art imaging facility world-wide. Neutron scintillator screens are the integral component of these imaging system that directly interacts with the neutron beam and dictates the neutron capture efficiency and image quality limitations of the imaging system. This work describes a novel approach for testing neutron scintillators that provides a simple and efficient way to measure relative light yield and detection efficiency over a range of scintillator thicknesses using a single scintillator screen and only a few radiographs. Additionally, two methods for correlating the screen thickness to the measured data were implemented and compared. An example 6LiF:ZnS scintillator screen with nominal thicknesses ranging from 0–300 μm was used to demonstrate this approach. The multi-thickness screen and image and data processing methods are not exclusive to neutron scintillator screens but could be applied to X-ray imaging as well. This approach has the potential to benefit the entire radiographic imaging community by offering an efficient path forward for manufacturers to develop higher-performance scintillators and for imaging facilities and service providers to determine the optimal screen parameters for their particular beam and imaging system.},
doi = {10.3390/jimaging6070056},
journal = {Journal of Imaging},
issn = {2313-433X},
number = 7,
volume = 6,
place = {Switzerland},
year = {2020},
month = {6}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.3390/jimaging6070056

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