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Title: Phonon-induced near-field resonances in multiferroic BiFeO3 thin films at infrared and THz wavelengths

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.5133116· OSTI ID:1633262
ORCiD logo [1];  [1]; ORCiD logo [2];  [3];  [4]; ORCiD logo [5];  [5]; ORCiD logo [6];  [1]
  1. Technische Univ. Dresden (Germany). Institute of Applied Physics
  2. Technische Univ. Dresden (Germany). Institute of Applied Physics; Helmholtz-Zentrum Dresden-Rossendorf, Dresden (Germany). Institute of Radiation Physics
  3. Helmholtz-Zentrum Dresden-Rossendorf, Dresden (Germany). Institute of Radiation Physics
  4. SanDisk, Western Digital Technologies Inc., Milpitas, CA (United States)
  5. Univ. of California, Berkeley, CA (United States)
  6. Technische Univ. Dresden (Germany). Institute of Applied Physics and Dresden-Wurzburg Cluster of Excellence-EXC 2147

Multiferroic BiFeO$$_3$$ (BFO) shows several phonon modes at infrared (IR) to THz energies, which are expected to carry information on any sample property coupled to crystal lattice vibrations. While macroscopic IR studies of BFO are often limited by single-crystal size, scattering-type scanning near-field optical microscopy (s-SNOM) allows for IR thin film spectroscopy of nanoscopic probing volumes with negligible direct substrate contribution to the optical signal. In fact, polaritons such as phonon polaritons of BFO introduce a resonant tip–sample coupling in s-SNOM, leading to both stronger signals and enhanced sensitivity to local material properties. Here in this paper, we explore the near-field response of BFO thin films at three consecutive resonances (centered around 5 THz, 13 THz, and 16 THz), by combining s-SNOM with a free-electron laser. We study the dependence of these near-field resonances on both the wavelength and tip–sample distance. Enabled by the broad spectral range of the measurement, we probe phonon modes connected to the predominant motion of either the bismuth or oxygen ions. Therefore, we propose s-SNOM at multiple near-field resonances as a versatile and very sensitive tool for the simultaneous investigation of various sample properties.

Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC); German Research Foundation (DFG); German Federal Ministry of Education and Research (BMBF)
Grant/Contract Number:
AC02-05CH11231; KE2068/2-1; 05K16ODA; 05K16ODC; 05K19ODA; 05K19ODB
OSTI ID:
1633262
Journal Information:
Applied Physics Letters, Vol. 116, Issue 7; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 16 works
Citation information provided by
Web of Science

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  • Keilmann, Fritz; Hillenbrand, Rainer
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