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Title: Global analysis peak fitting for chemical spectroscopy data

Abstract

The present invention relates to methods for analyzing a chemical sample. For instance, the methods herein allow for global analysis of spectroscopy data in order to extract useful chemical properties from complicated multidimensional data. Such analysis can optionally employ data compression to further expedite computer-implemented computation. In particular, the methods herein provide global analysis of data matrices explained by both linear and non-linear terms.

Inventors:
;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1632523
Patent Number(s):
10,551,247
Application Number:
15/082,922
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Resource Relation:
Patent File Date: 03/28/2016
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 97 MATHEMATICS AND COMPUTING

Citation Formats

Van Benthem, Mark, and Ohlhausen, James A. Global analysis peak fitting for chemical spectroscopy data. United States: N. p., 2020. Web.
Van Benthem, Mark, & Ohlhausen, James A. Global analysis peak fitting for chemical spectroscopy data. United States.
Van Benthem, Mark, and Ohlhausen, James A. Tue . "Global analysis peak fitting for chemical spectroscopy data". United States. https://www.osti.gov/servlets/purl/1632523.
@article{osti_1632523,
title = {Global analysis peak fitting for chemical spectroscopy data},
author = {Van Benthem, Mark and Ohlhausen, James A.},
abstractNote = {The present invention relates to methods for analyzing a chemical sample. For instance, the methods herein allow for global analysis of spectroscopy data in order to extract useful chemical properties from complicated multidimensional data. Such analysis can optionally employ data compression to further expedite computer-implemented computation. In particular, the methods herein provide global analysis of data matrices explained by both linear and non-linear terms.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {2}
}

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Works referenced in this record:

Apparatus and system for multivariate spectral analysis
patent, June 2003


Visual object appearance modelling using image processing
patent, June 2014


Method to analyze remotely sensed spectral data
patent, February 2009


Method for factor analysis of GC/MS data
patent, September 2012


Method of multivariate spectral analysis
patent, January 2004


Augmented classical least squares multivariate spectral analysis
patent, July 2005