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Hardware-in-the-loop Testing of Signal Temporal Logic Frequency Control in a Microgrid

Conference ·
OSTI ID:1632098

This paper presents a hardware-in-the-loop (HITL) testing and lessons learned for a signal temporal logic (STL) frequency control in a microgrid setting. In contrast to most, if not all, traditional control mechanisms, the STL control allows for including temporal constraints in the control formulation to handle sophisticated specifications from grid codes and protection relays. This feature provides richer descriptions of control specifications to address both magnitude and time simultaneously, hence a valuable tool for power system operation and control. An ultra-low voltage (24V) HITL microgrid platform consisting of two type-3 wind turbine generators and one diesel generator is used to test the proposed STL frequency control. In experimental case studies, we demonstrate that the HITL frequency responses closely match the simulated ones and strictly satisfy the designed STL control specifications.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-00OR22725
OSTI ID:
1632098
Resource Relation:
Conference: The Eleventh Conference on Innovative Smart Grid Technologies (ISGT 2020) - Washington, District of Columbia, United States of America - 2/17/2020 5:00:00 AM-2/20/2020 5:00:00 AM
Country of Publication:
United States
Language:
English