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Title: Structure and basal twinning of topological insulator Bi2Se3 grown by MBE onto crystalline Y3Fe5O12

Journal Article · · Physical Review Materials
 [1];  [2];  [3];  [3];  [4];  [5];  [5];  [5];  [3];  [2]; ORCiD logo [2]
  1. Univ. of Minnesota, Minneapolis, MN (United States); Pennsylvania State Univ., University Park, PA (United States)
  2. Univ. of Minnesota, Minneapolis, MN (United States)
  3. Pennsylvania State Univ., University Park, PA (United States)
  4. Pennsylvania State Univ., University Park, PA (United States); Univ. of California, Santa Barbara, CA (United States)
  5. Colorado State Univ., Fort Collins, CO (United States)

Whereas thin films of topological insulators grown by molecular beam epitaxy often display regular, triangular features, Bi2Se3 films grown onto yttrium iron garnet (YIG) display much greater disorder. Here, we present observations of various types of disorder present in these films using atomic force microscopy and scanning transmission electron microscopy. Furthermore, the investigation reveals the presence of an amorphous metal oxide layer between the substrate and the film, which appears to smooth out the nanometer-scale undulations in the YIG surface. It also shows the existence of quasiordered arrays of heavy atoms in some interfacial regions, as well as rotations and tilting between adjacent grains and basal twinning at various heights in the film. Using density functional theory, we explore the impact of these prominent basal twins on the electronic structure of the film.

Research Organization:
Colorado State Univ., Fort Collins, CO (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
SC0018994
OSTI ID:
1613049
Alternate ID(s):
OSTI ID: 1546366
Journal Information:
Physical Review Materials, Vol. 3, Issue 6; ISSN 2475-9953
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 8 works
Citation information provided by
Web of Science

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  • Levy, Ido; Garcia, Thor Axtmann; Shafique, Sharmin
  • Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Vol. 36, Issue 2 https://doi.org/10.1116/1.5017977
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Cited By (1)

Large-scale interlayer rotations and Te grain boundaries in ( Bi , Sb ) 2 Te 3 thin films journal January 2020