High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation

Chen, Z.; Lenthe, W.; Stinville, J. C.; Echlin, M.; Pollock, T. M.; Daly, S.

doi:10.1007/s11340-018-0419-y

High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation

Journal Article · 29 August 2018 · Experimental Mechanics

DOI:https://doi.org/10.1007/s11340-018-0419-y· OSTI ID:1611100

; Lenthe, W.; Stinville, J. C.; Echlin, M.; Pollock, T. M.; Daly, S.

Not provided.

Research Organization:: Univ. of Michigan, Ann Arbor, MI (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0008637

OSTI ID:: 1611100

Journal Information:: Experimental Mechanics, Vol. 58, Issue 9; ISSN 0014-4851

Publisher:: Springer

Country of Publication:: United States

Language:: English

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