Cryogenic characterization of titanium nitride thin films

Vertchenko, Larissa; Leandro, Lorenzo; Shkondin, Evgeniy; Takayama, Osamu; Bondarev, Igor V.; Akopian, Nika; Lavrinenko, Andrei V.

doi:10.1364/ome.9.002117

Cryogenic characterization of titanium nitride thin films

Journal Article · 01 January 2019 · Optical Materials Express

DOI:https://doi.org/10.1364/ome.9.002117· OSTI ID:1610940

; Leandro, Lorenzo; Shkondin, Evgeniy; ; ; Akopian, Nika; Lavrinenko, Andrei V.

Not provided.

Research Organization:: North Carolina Central Univ., Durham, NC (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0007117

OSTI ID:: 1610940

Journal Information:: Optical Materials Express, Vol. 9, Issue 5; ISSN 2159-3930

Publisher:: Optical Society of America (OSA)

Country of Publication:: United States

Language:: English

References (29)

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