Investigation of amorphous germanium contact properties with planar detectors made from USD-grown germanium crystals

Wei, W. -Z.; Meng, X. -H.; Li, Y. -Y.; Liu, J.; Wang, G. -J.; Mei, H.; Yang, G.; Mei, D. -M.; Zhang, C.

doi:10.1088/1748-0221/13/12/p12026

Investigation of amorphous germanium contact properties with planar detectors made from USD-grown germanium crystals

Journal Article · 01 December 2018 · Journal of Instrumentation

DOI:https://doi.org/10.1088/1748-0221/13/12/p12026· OSTI ID:1610755

Wei, W. -Z.; Meng, X. -H.; Li, Y. -Y.; Liu, J.; Wang, G. -J.; Mei, H.; Yang, G.; Mei, D. -M.; Zhang, C.

Not provided.

Research Organization:: Univ. of South Dakota, Vermillion, SD (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0004768

OSTI ID:: 1610755

Journal Information:: Journal of Instrumentation, Vol. 13, Issue 12; ISSN 1748-0221

Publisher:: Institute of Physics (IOP)

Country of Publication:: United States

Language:: English

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