Bias Between ENDF/B-VIII and ENDF/B-VII.1 for LEU Pin Array Systems
Extensive testing of new cross section data is performed in SCALE prior to its release. The release of ENDF/B-VIII.0 requires the generation and testing of new data libraries which are planned to be included in the release of SCALE 6.3 in 2019 or 2020. KENO benchmark results have been published previously for beta and final releases of ENDF/B-VIII.0 using the entire Verified, Archived Library of Inputs and Data (VALID). This work presents an energy-dependent change in the results for low-enriched uranium (LEU) pin array systems. The process of identifying the difference is highlighted as a case study to determine how data testing and benchmarking can be performed to provide more detailed feedback to the data community on potential data deficiencies.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA), Nuclear Criticality Safety Program (NCSP)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1607083
- Journal Information:
- Transactions of the American Nuclear Society, Vol. 121, Issue 1; Conference: 2019 ANS Winter Meeting and Nuclear Technology Expo, Washington, DC (United States), 17-21 Nov 2019; Related Information: https://www.ans.org/meetings/view-wm2019/; ISSN 0003-018X
- Publisher:
- American Nuclear Society
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
97 MATHEMATICS AND COMPUTING
Nuclear Criticality Safety Program (NCSP)
Analytical Methods
Verified
Archived Library of Inputs and Data (VALID)
Low-Enriched Uranium (LEU)
Evaluated Nuclear Data File (ENDF)
SCALE
KENO
International Criticality Safety Benchmark Evaluation Project (ICSBEP)