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Title: Microstructure Study on Initial Lithiation/Delithiation Cycle of Crystalline Silicon Wafer

Abstract

In this work, we found that Si wafer has a preferential expansion along <110> directions during the initial lithiation/delithiation cycle, as the evidence of wider <110> cracks. These cracks also propagate much deep, at least 5 um. The morphology of the amorphous Si layer appearing after the initial cycle shows a dependence on the plane orientation, i.e., multi and deep layers on the {110} plane, where as a single layer with ~200nm on the {100} plane.A PAA coating layer on the Si wafer mitigates the cracks and reduces the thickness of the amorphous Si layer.

Authors:
 [1]; ORCiD logo [1];  [1];  [1]
  1. National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
OSTI Identifier:
1605538
Report Number(s):
NREL/JA-5K00-76364
DOE Contract Number:  
AC36-08GO28308
Resource Type:
Journal Article
Journal Name:
Microscopy and Microanalysis
Additional Journal Information:
Journal Volume: 25; Journal Issue: Supplement S2
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; silicon wafers; microstructure; anode materials

Citation Formats

Liu, Jun, Yoon, Taeho, Al-Jassim, Mowafak M, and Ban, Chunmei. Microstructure Study on Initial Lithiation/Delithiation Cycle of Crystalline Silicon Wafer. United States: N. p., 2019. Web. doi:10.1017/S143192761901122X.
Liu, Jun, Yoon, Taeho, Al-Jassim, Mowafak M, & Ban, Chunmei. Microstructure Study on Initial Lithiation/Delithiation Cycle of Crystalline Silicon Wafer. United States. doi:10.1017/S143192761901122X.
Liu, Jun, Yoon, Taeho, Al-Jassim, Mowafak M, and Ban, Chunmei. Mon . "Microstructure Study on Initial Lithiation/Delithiation Cycle of Crystalline Silicon Wafer". United States. doi:10.1017/S143192761901122X.
@article{osti_1605538,
title = {Microstructure Study on Initial Lithiation/Delithiation Cycle of Crystalline Silicon Wafer},
author = {Liu, Jun and Yoon, Taeho and Al-Jassim, Mowafak M and Ban, Chunmei},
abstractNote = {In this work, we found that Si wafer has a preferential expansion along <110> directions during the initial lithiation/delithiation cycle, as the evidence of wider <110> cracks. These cracks also propagate much deep, at least 5 um. The morphology of the amorphous Si layer appearing after the initial cycle shows a dependence on the plane orientation, i.e., multi and deep layers on the {110} plane, where as a single layer with ~200nm on the {100} plane.A PAA coating layer on the Si wafer mitigates the cracks and reduces the thickness of the amorphous Si layer.},
doi = {10.1017/S143192761901122X},
journal = {Microscopy and Microanalysis},
number = Supplement S2,
volume = 25,
place = {United States},
year = {2019},
month = {8}
}

Works referenced in this record:

Structural Changes in Silicon Anodes during Lithium Insertion/Extraction
journal, January 2004

  • Obrovac, M. N.; Christensen, Leif
  • Electrochemical and Solid-State Letters, Vol. 7, Issue 5
  • DOI: 10.1149/1.1652421