skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Fill Factor Loss in Fielded Photovoltaic Modules Due to Metallization Failures, Characterized by Luminescence and Thermal Imaging

Abstract

Understanding the causes of photovoltaic module failure in the field can be achieved using spatially-resolved imaging tools in combination with current-voltage (IV) characterization. We evaluate 23 field-degraded modules by comparing their IV characteristics with module images obtained by electroluminescence, photoluminescence, UV-fluorescence, and dark lock-in thermography. We identify primarily metallization failures (metallization series resistance, solder point heating, broken fingers, disrupted interconnects) in these modules that has led to a severe drop in the fill factor and up to 35% power loss over only 2 years of deployment.

Authors:
 [1];  [1];  [2]
  1. National Renewable Energy Laboratory (NREL), Golden, CO (United States)
  2. PV Evolution Labs
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S), Durable Modules Consortium (DuraMAT)
OSTI Identifier:
1603899
Report Number(s):
NREL/CP-5K00-73526
DOE Contract Number:  
AC36-08GO28308
Resource Type:
Conference
Resource Relation:
Conference: Presented at the 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 16-21 June 2019, Chicago, Illinois
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 42 ENGINEERING; imaging; solar panels; photoluminescence; electroluminescence; thermal analysis; reliability

Citation Formats

Kern, Dana B, Johnston, Steven, and Meydbray, Jenya. Fill Factor Loss in Fielded Photovoltaic Modules Due to Metallization Failures, Characterized by Luminescence and Thermal Imaging. United States: N. p., 2020. Web. doi:10.1109/PVSC40753.2019.8980840.
Kern, Dana B, Johnston, Steven, & Meydbray, Jenya. Fill Factor Loss in Fielded Photovoltaic Modules Due to Metallization Failures, Characterized by Luminescence and Thermal Imaging. United States. https://doi.org/10.1109/PVSC40753.2019.8980840
Kern, Dana B, Johnston, Steven, and Meydbray, Jenya. Thu . "Fill Factor Loss in Fielded Photovoltaic Modules Due to Metallization Failures, Characterized by Luminescence and Thermal Imaging". United States. https://doi.org/10.1109/PVSC40753.2019.8980840.
@article{osti_1603899,
title = {Fill Factor Loss in Fielded Photovoltaic Modules Due to Metallization Failures, Characterized by Luminescence and Thermal Imaging},
author = {Kern, Dana B and Johnston, Steven and Meydbray, Jenya},
abstractNote = {Understanding the causes of photovoltaic module failure in the field can be achieved using spatially-resolved imaging tools in combination with current-voltage (IV) characterization. We evaluate 23 field-degraded modules by comparing their IV characteristics with module images obtained by electroluminescence, photoluminescence, UV-fluorescence, and dark lock-in thermography. We identify primarily metallization failures (metallization series resistance, solder point heating, broken fingers, disrupted interconnects) in these modules that has led to a severe drop in the fill factor and up to 35% power loss over only 2 years of deployment.},
doi = {10.1109/PVSC40753.2019.8980840},
url = {https://www.osti.gov/biblio/1603899}, journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {2}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share: