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Title: Thallium bromide (TIBr) semiconductors and devices with extended life apparatus, methods, and system

Patent ·
OSTI ID:1600434

Various technologies pertaining to formation or treatment of a thallium bromide crystal to improve the operable lifespan of a device that incorporates the thallium bromide crystal are described herein. In exemplary embodiments, treatments including focused ion beam implantation, selective material removal, and buffer layer application are performed on a thallium bromide crystal to inhibit motion of dislocations toward a region at which an electrical contact is desirably installed. In other exemplary embodiments, a thallium bromide crystal is doped with impurities during formation that inhibit the motion of dislocations in the crystal. In still other exemplary embodiments, a thallium bromide crystal is formed by way of processes that inhibit dislocation formation during crystal growth or eliminate dislocations in an existing thallium bromide mass.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
NA0003525
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
Patent Number(s):
10,516,068
Application Number:
15/862,307
OSTI ID:
1600434
Resource Relation:
Patent File Date: 01/04/2018
Country of Publication:
United States
Language:
English

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Stabilized Thallium Bromide Radiation Detectors and Methods of Making the Same patent-application April 2014
Mixed Ionic-Electronic Conductor-Based Radiation Detectors and Methods of Fabrication patent-application January 2013
Selective Surface Treatment of Thallium Bromide (TlBr)-Based Detectors to Improve Longevity and/or Restore Operational Capacity Thereof patent-application May 2018
Radiation detectors patent November 2016
Ionic Junction for Radiation Detectors patent-application June 2012