Atomic-scale imaging of ultrafast materials dynamics

Flannigan, David J.; Lindenberg, Aaron M.

doi:10.1557/mrs.2018.146

Atomic-scale imaging of ultrafast materials dynamics

Journal Article · 10 July 2018 · MRS Bulletin

DOI:https://doi.org/10.1557/mrs.2018.146· OSTI ID:1595049

Flannigan, David J. ^[1]; Lindenberg, Aaron M. ^[2]

Univ. of Minnesota, Minneapolis, MN (United States)
Stanford Univ., CT (United States)

The advent of short-pulse electron and x-ray sources has enabled pump-probe approaches for elucidating ultrafast materials dynamics. From such studies, a comprehensive picture of the time-dependent evolution of the initial steps of energy deposition, propagation, relaxation, and conversion in a wide range of materials can be generated. In this article, we provide an overview of the capabilities of femtosecond electron and x-ray scattering for resolving structural dynamics of materials. With such approaches, time resolutions are ultimately limited by the durations of the electron and x-ray pulses, and dynamics can be studied at length scales spanning atomic to mesoscale dimensions. The articles in this issue represent a cross section of the vigorous activity occurring in the study of light-induced ultrafast materials dynamics as it relates to charge carriers, surfaces and interfaces, lattice-coupling mechanisms, coherent structural motions, and next-generation instrument development. Finally, the approaches highlighted here are leading to new physical insights, new possibilities for engineering the properties of matter, and ultimately, a new understanding of materials functionality on ultrasmall and ultrashort spatiotemporal scales.

Research Organization:: Univ. of Minnesota, Minneapolis, MN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division

DOE Contract Number:: SC0018204; AC02-76SF00515

OSTI ID:: 1595049

Journal Information:: MRS Bulletin, Vol. 43, Issue 7; ISSN 0883-7694

Publisher:: Materials Research Society

Country of Publication:: United States

Language:: English

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