X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3
Abstract
Synchrotron X-ray Scanning Tunneling Microscopy (SX-STM) is a novel imaging technique capable of providing real space chemically specific mapping with a potential of reaching atomic resolution. Determination of chemical composition along with ultra-high resolution imaging by SX-STM can be realized through excitation of core electrons by incident X-rays when their energy is tuned to an absorption edge of a particular atom during raster scanning, as is done in the conventional STM experiments. In this work, we provide a brief summary and the current status of SX-STM and discuss its applications for material science. In particular, we discuss instrumentation challenges associated with the SX-STM technique and present early experiments on Cu doped ZrTe3 single crystals.
- Authors:
-
- Univ. of Louisiana at Lafayette, Lafayette, LA (United States)
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Publication Date:
- Research Org.:
- Brookhaven National Laboratory (BNL), Upton, NY (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- Brookhaven National Laboratory (BNL), Laboratory Directed Research and Development; USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
- OSTI Identifier:
- 1576223
- Alternate Identifier(s):
- OSTI ID: 1577254
- Report Number(s):
- BNL-212361-2019-JAAM
Journal ID: ISSN 2073-4352; CRYSBC; TRN: US2001482
- Grant/Contract Number:
- SC0012704; AC02-06CH11357
- Resource Type:
- Journal Article: Accepted Manuscript
- Journal Name:
- Crystals
- Additional Journal Information:
- Journal Volume: 9; Journal Issue: 11; Journal ID: ISSN 2073-4352
- Publisher:
- MDPI
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; SX-STM; scanning microscopy; synchrotron; smart tips; elemental mapping; scanning microscop
Citation Formats
Yan, Hui, Shirato, Nozomi, Zhu, Xiangde, Rosenmann, Daniel, Tong, Xiao, Xu, Weihe, Petrovic, Cedomir, Rose, Volker, and Nazaretski, Evgeny. X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3. United States: N. p., 2019.
Web. doi:10.3390/cryst9110588.
Yan, Hui, Shirato, Nozomi, Zhu, Xiangde, Rosenmann, Daniel, Tong, Xiao, Xu, Weihe, Petrovic, Cedomir, Rose, Volker, & Nazaretski, Evgeny. X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3. United States. https://doi.org/10.3390/cryst9110588
Yan, Hui, Shirato, Nozomi, Zhu, Xiangde, Rosenmann, Daniel, Tong, Xiao, Xu, Weihe, Petrovic, Cedomir, Rose, Volker, and Nazaretski, Evgeny. 2019.
"X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3". United States. https://doi.org/10.3390/cryst9110588. https://www.osti.gov/servlets/purl/1576223.
@article{osti_1576223,
title = {X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3},
author = {Yan, Hui and Shirato, Nozomi and Zhu, Xiangde and Rosenmann, Daniel and Tong, Xiao and Xu, Weihe and Petrovic, Cedomir and Rose, Volker and Nazaretski, Evgeny},
abstractNote = {Synchrotron X-ray Scanning Tunneling Microscopy (SX-STM) is a novel imaging technique capable of providing real space chemically specific mapping with a potential of reaching atomic resolution. Determination of chemical composition along with ultra-high resolution imaging by SX-STM can be realized through excitation of core electrons by incident X-rays when their energy is tuned to an absorption edge of a particular atom during raster scanning, as is done in the conventional STM experiments. In this work, we provide a brief summary and the current status of SX-STM and discuss its applications for material science. In particular, we discuss instrumentation challenges associated with the SX-STM technique and present early experiments on Cu doped ZrTe3 single crystals.},
doi = {10.3390/cryst9110588},
url = {https://www.osti.gov/biblio/1576223},
journal = {Crystals},
issn = {2073-4352},
number = 11,
volume = 9,
place = {United States},
year = {Sat Nov 09 00:00:00 EST 2019},
month = {Sat Nov 09 00:00:00 EST 2019}
}
Web of Science
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