How far does the defect tolerance of lead-halide perovskites range? The example of Bi impurities introducing efficient recombination centers
Journal Article
·
· Journal of Materials Chemistry. A
- École Polytechnique Fédérale de Lausanne; Laboratory of Photomolecular Science; CH-1015 Lausanne; Switzerland; Department of Chemistry
- École Polytechnique Fédérale de Lausanne; Laboratory of Photomolecular Science; CH-1015 Lausanne; Switzerland
- Department of Mechanical and Aerospace Engineering; University of Rome “Sapienza”; 00184 Roma; Italy
- École Polytechnique Fédérale de Lausanne; Laboratory of Photomolecular Science; CH-1015 Lausanne; Switzerland; Department of Electrical and Electronic Engineering
- Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab); Institute of Microengineering (IMT); École Polytechnique Fédérale de Lausanne (EPFL); Neuchâtel 2002; Switzerland
- Massachusetts Institute of Technology; Cambridge; USA
- Department of Chemistry; University of Cologne; 50939 Cologne; Germany
- Departamento de Química; Universidad Nacional de Río Cuarto; Córdoba; Argentina
- Experimental Physics VI; Julius Maximilian University of Würzburg; 97074 Würzburg; Germany
- Department of Electrical and Electronic Engineering; The University of Hong Kong; Hong Kong SAR; China
- Dipartimento di Fisica; Università di Cagliari; Consiglio Nazionale delle Ricerche CNR-IOM; Cittadella Universitaria; Monserrato 09042-I (CA)
- Institut für Siliziumphotovoltaik; Helmholtz-Zentrum Berlin für Materialien and Energie GmbH; 12489 Berlin; Germany
Experimental and theoretical study on the effect of shallow and deep defects on photovoltaic performance, luminescence, surface photovoltage, and density of states.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Sponsoring Organization:
- FOREIGN
- OSTI ID:
- 1575035
- Journal Information:
- Journal of Materials Chemistry. A, Vol. 7, Issue 41; ISSN 2050-7488
- Publisher:
- Royal Society of Chemistry
- Country of Publication:
- United States
- Language:
- ENGLISH
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