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Title: Oxybarometry and valence quantification based on microscale X-ray absorption fine structure (XAFS) spectroscopy of multivalent elements

Authors:
ORCiD logo; ; ; ORCiD logo;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
DOE - BASIC ENERGY SCIENCESNASANSF
OSTI Identifier:
1575029
Resource Type:
Journal Article
Journal Name:
Chemical Geology
Additional Journal Information:
Journal Volume: 531; Journal Issue: C; Journal ID: ISSN 0009-2541
Publisher:
Elsevier
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Sutton, S. R., Lanzirotti, A., Newville, M., Dyar, M. Darby, and Delaney, J. Oxybarometry and valence quantification based on microscale X-ray absorption fine structure (XAFS) spectroscopy of multivalent elements. United States: N. p., 2020. Web. doi:10.1016/j.chemgeo.2019.119305.
Sutton, S. R., Lanzirotti, A., Newville, M., Dyar, M. Darby, & Delaney, J. Oxybarometry and valence quantification based on microscale X-ray absorption fine structure (XAFS) spectroscopy of multivalent elements. United States. doi:10.1016/j.chemgeo.2019.119305.
Sutton, S. R., Lanzirotti, A., Newville, M., Dyar, M. Darby, and Delaney, J. Wed . "Oxybarometry and valence quantification based on microscale X-ray absorption fine structure (XAFS) spectroscopy of multivalent elements". United States. doi:10.1016/j.chemgeo.2019.119305.
@article{osti_1575029,
title = {Oxybarometry and valence quantification based on microscale X-ray absorption fine structure (XAFS) spectroscopy of multivalent elements},
author = {Sutton, S. R. and Lanzirotti, A. and Newville, M. and Dyar, M. Darby and Delaney, J.},
abstractNote = {},
doi = {10.1016/j.chemgeo.2019.119305},
journal = {Chemical Geology},
issn = {0009-2541},
number = C,
volume = 531,
place = {United States},
year = {2020},
month = {1}
}