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Title: Surface-induced thickness limit of conducting La-doped SrTiO[subscript 3] thin films

Authors:
; ; ; ;  [1]
  1. Yale
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
U.S. AIR FORCE- OFFICE OF SCIENTIFIC RESEARCH
OSTI Identifier:
1575016
Resource Type:
Journal Article
Journal Name:
Appl. Phys. Lett.
Additional Journal Information:
Journal Volume: 115; Journal Issue: 2019
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Shin, Yeong Jae, Lau, Claudia, Lee, Sangjae, Walker, Frederick J., and Ahn, Charles H. Surface-induced thickness limit of conducting La-doped SrTiO[subscript 3] thin films. United States: N. p., 2019. Web. doi:10.1063/1.5111771.
Shin, Yeong Jae, Lau, Claudia, Lee, Sangjae, Walker, Frederick J., & Ahn, Charles H. Surface-induced thickness limit of conducting La-doped SrTiO[subscript 3] thin films. United States. doi:10.1063/1.5111771.
Shin, Yeong Jae, Lau, Claudia, Lee, Sangjae, Walker, Frederick J., and Ahn, Charles H. Mon . "Surface-induced thickness limit of conducting La-doped SrTiO[subscript 3] thin films". United States. doi:10.1063/1.5111771.
@article{osti_1575016,
title = {Surface-induced thickness limit of conducting La-doped SrTiO[subscript 3] thin films},
author = {Shin, Yeong Jae and Lau, Claudia and Lee, Sangjae and Walker, Frederick J. and Ahn, Charles H.},
abstractNote = {},
doi = {10.1063/1.5111771},
journal = {Appl. Phys. Lett.},
number = 2019,
volume = 115,
place = {United States},
year = {2019},
month = {11}
}

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