skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Microhardness Study of CdZnTeSe Crystals for X-ray and Gamma ray Detectors

Abstract

A quaternary material Cd 1-x ZnxTe 1-y Sey (CZTS) is currently under investigation for its application as a material for hard X-ray and gamma ray detectors. The addition of selenium was found to be very effective in suppressing the formation of sub-grain boundaries and their networks. The CZTS crystals were grown by the THM technique at Brookhaven National Laboratory. The ingots are ~52 mm in diameter, weighting about 1.0-1.2 kg. In general, the ingots were crack-free except near the Te-CZTS interface. The goal of the presented work is to increase our understanding of key factors influencing the crystal quality and its suitability for radiation detection by a study of its mechanical properties, namely the microhardness and its dependence on crystal composition. Microhardness is closely connected to dislocations and their mobility. We report here on a detailed microhardness characterization and its correlation to the crystal composition of quaternary material Cd 1-xZnxTe 1-ySe y. Measurements of the Vickers microhardness, resistivity mapping, photoluminescence, and Zn and Se composition analysis were employed along the crystal growth axis. The microhardness values, bandgap and Zn and Se composition along the crystal axis have been correlated. We also performed comparative study of a set of CdTe andmore » CdZnTe samples prepared in the crystal growth laboratory of the Institute of Physics of Charles University or originating from commercial sources.« less

Authors:
;
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA), Office of Nonproliferation and Verification Research and Development (NA-22)
OSTI Identifier:
1574912
Report Number(s):
BNL-212352-2019-COPR
DOE Contract Number:  
SC0012704
Resource Type:
Conference
Resource Relation:
Conference: 2019 Nuclear Science Symposium (NSS) and Medical Imaging Conference, Manchester Convention Centre, Manchester, UK, 10/26/2019 - 11/2/2019
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Moravec, P., and Roy, Utpal. Microhardness Study of CdZnTeSe Crystals for X-ray and Gamma ray Detectors. United States: N. p., 2019. Web.
Moravec, P., & Roy, Utpal. Microhardness Study of CdZnTeSe Crystals for X-ray and Gamma ray Detectors. United States.
Moravec, P., and Roy, Utpal. Sat . "Microhardness Study of CdZnTeSe Crystals for X-ray and Gamma ray Detectors". United States. https://www.osti.gov/servlets/purl/1574912.
@article{osti_1574912,
title = {Microhardness Study of CdZnTeSe Crystals for X-ray and Gamma ray Detectors},
author = {Moravec, P. and Roy, Utpal},
abstractNote = {A quaternary material Cd1-x ZnxTe1-y Sey (CZTS) is currently under investigation for its application as a material for hard X-ray and gamma ray detectors. The addition of selenium was found to be very effective in suppressing the formation of sub-grain boundaries and their networks. The CZTS crystals were grown by the THM technique at Brookhaven National Laboratory. The ingots are ~52 mm in diameter, weighting about 1.0-1.2 kg. In general, the ingots were crack-free except near the Te-CZTS interface. The goal of the presented work is to increase our understanding of key factors influencing the crystal quality and its suitability for radiation detection by a study of its mechanical properties, namely the microhardness and its dependence on crystal composition. Microhardness is closely connected to dislocations and their mobility. We report here on a detailed microhardness characterization and its correlation to the crystal composition of quaternary material Cd1-xZnxTe1-ySey. Measurements of the Vickers microhardness, resistivity mapping, photoluminescence, and Zn and Se composition analysis were employed along the crystal growth axis. The microhardness values, bandgap and Zn and Se composition along the crystal axis have been correlated. We also performed comparative study of a set of CdTe and CdZnTe samples prepared in the crystal growth laboratory of the Institute of Physics of Charles University or originating from commercial sources.},
doi = {},
url = {https://www.osti.gov/biblio/1574912}, journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {10}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share: