Charge Transfer and Built-in Electric Fields Between a Crystalline Oxide and Silicon
Abstract
We report charge transfer and built-in electric fields across the epitaxial SrNbxTi1-xO3-d / Si(001) interface. Electrical transport measurements indicate the formation of a hole gas in the Si and the presence of built-in fields. Hard x-ray photoelectron measurements reveal pronounced asymmetries in core-level spectra that arise from these built-in fields. Analysis of these asymmetries enables built-in fields to be spatially mapped across the heterojunction. The demonstration of tunable charge transfer, built-in fields, and the spatial mapping of the latter, lays the groundwork for the development of electrically coupled, functional heterojunctions.
- Authors:
-
- University of Texas at Arlington
- National Institute of Standards and Technology
- North Carolina State University
- BATTELLE (PACIFIC NW LAB)
- Synchrotron SOLEIL
- Diamond Light Source, Ltd.
- Publication Date:
- Research Org.:
- Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1573798
- Report Number(s):
- PNNL-SA-144010
- DOE Contract Number:
- AC05-76RL01830
- Resource Type:
- Journal Article
- Journal Name:
- Physical Review Letters
- Additional Journal Information:
- Journal Volume: 123; Journal Issue: 2
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Lim, Zhenghui, Quackenbush, Nicholas, Penn, Aubrey, Chrysler, M, Bowden, Mark E., Zhu, Zihua, Ablett, James, Lee, Tien-Lin, LeBeau, James M., Woicik, Joseph C., Sushko, Petr V., Chambers, Scott A., and Ngai, Joseph. Charge Transfer and Built-in Electric Fields Between a Crystalline Oxide and Silicon. United States: N. p., 2019.
Web. doi:10.1103/PhysRevLett.123.026805.
Lim, Zhenghui, Quackenbush, Nicholas, Penn, Aubrey, Chrysler, M, Bowden, Mark E., Zhu, Zihua, Ablett, James, Lee, Tien-Lin, LeBeau, James M., Woicik, Joseph C., Sushko, Petr V., Chambers, Scott A., & Ngai, Joseph. Charge Transfer and Built-in Electric Fields Between a Crystalline Oxide and Silicon. United States. doi:10.1103/PhysRevLett.123.026805.
Lim, Zhenghui, Quackenbush, Nicholas, Penn, Aubrey, Chrysler, M, Bowden, Mark E., Zhu, Zihua, Ablett, James, Lee, Tien-Lin, LeBeau, James M., Woicik, Joseph C., Sushko, Petr V., Chambers, Scott A., and Ngai, Joseph. Thu .
"Charge Transfer and Built-in Electric Fields Between a Crystalline Oxide and Silicon". United States. doi:10.1103/PhysRevLett.123.026805.
@article{osti_1573798,
title = {Charge Transfer and Built-in Electric Fields Between a Crystalline Oxide and Silicon},
author = {Lim, Zhenghui and Quackenbush, Nicholas and Penn, Aubrey and Chrysler, M and Bowden, Mark E. and Zhu, Zihua and Ablett, James and Lee, Tien-Lin and LeBeau, James M. and Woicik, Joseph C. and Sushko, Petr V. and Chambers, Scott A. and Ngai, Joseph},
abstractNote = {We report charge transfer and built-in electric fields across the epitaxial SrNbxTi1-xO3-d / Si(001) interface. Electrical transport measurements indicate the formation of a hole gas in the Si and the presence of built-in fields. Hard x-ray photoelectron measurements reveal pronounced asymmetries in core-level spectra that arise from these built-in fields. Analysis of these asymmetries enables built-in fields to be spatially mapped across the heterojunction. The demonstration of tunable charge transfer, built-in fields, and the spatial mapping of the latter, lays the groundwork for the development of electrically coupled, functional heterojunctions.},
doi = {10.1103/PhysRevLett.123.026805},
journal = {Physical Review Letters},
number = 2,
volume = 123,
place = {United States},
year = {2019},
month = {7}
}
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