Single-Shot Diagnostics of Microbunched Electrons in Laser-Driven Plasma Accelerators and Free-Electron Lasers

Lumpkin, Alex H.; Rule, Donald W.

Title: Single-Shot Diagnostics of Microbunched Electrons in Laser-Driven Plasma Accelerators and Free-Electron Lasers

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Abstract

In general, the inherent statistical variances in the laser-driven plasma accelerators (LPAs) and self-amplified spontaneous emission (SASE) free electron lasers (FELs) motivate the use of single-shot diagnostics. In addition, the microbunching phenomenon in each is also variable, so coherent optical transition radiation (COTR) techniques also warrant single-shot evaluations. In both cases, the enhancements of the signals enable optical beam splitters to be used to direct light to the different measuring devices for electron beam size, divergence, spectral content, and/or bunch length as appropriate. COTR Interferometry (COTRI) modelling results for the pre-buncher case at 266 nm and for the LPA case at 633 nm are presented. In addition, examples of few-micron beam size and sub-mrad beam divergence measurements from a single shot of an LPA are reported.

Authors:

Lumpkin, Alex H. ^[1]; Rule, Donald W. ^[2]

Fermilab
Unlisted, MD

Publication Date:: 2019-09-01

Research Org.:: Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)

Sponsoring Org.:: USDOE Office of Science (SC), High Energy Physics (HEP)

OSTI Identifier:: 1572510

Report Number(s):: FERMILAB-CONF-19-467-AD
oai:inspirehep.net:1761796

DOE Contract Number:: AC02-07CH11359

Resource Type:: Conference

Resource Relation:: Conference: 8th International Beam Instrumentation Conference, Malmo, Sweden, 09/08-09/12/2019

Country of Publication:: United States

Language:: English

Subject:: 43 PARTICLE ACCELERATORS

Citation Formats


                    Lumpkin, Alex H., and Rule, Donald W.. Single-Shot Diagnostics of Microbunched Electrons in Laser-Driven Plasma Accelerators and Free-Electron Lasers.  United States: N. p., 2019. 
        Web.

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                    Lumpkin, Alex H., & Rule, Donald W.. Single-Shot Diagnostics of Microbunched Electrons in Laser-Driven Plasma Accelerators and Free-Electron Lasers.  United States.

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                    Lumpkin, Alex H., and Rule, Donald W.. 2019.  
        "Single-Shot Diagnostics of Microbunched Electrons in Laser-Driven Plasma Accelerators and Free-Electron Lasers".  United States.  https://www.osti.gov/servlets/purl/1572510.

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@article{osti_1572510,

  title        = {Single-Shot Diagnostics of Microbunched Electrons in Laser-Driven Plasma Accelerators and Free-Electron Lasers},

  author       = {Lumpkin, Alex H. and Rule, Donald W.},

  abstractNote = {In general, the inherent statistical variances in the laser-driven plasma accelerators (LPAs) and self-amplified spontaneous emission (SASE) free electron lasers (FELs) motivate the use of single-shot diagnostics. In addition, the microbunching phenomenon in each is also variable, so coherent optical transition radiation (COTR) techniques also warrant single-shot evaluations. In both cases, the enhancements of the signals enable optical beam splitters to be used to direct light to the different measuring devices for electron beam size, divergence, spectral content, and/or bunch length as appropriate. COTR Interferometry (COTRI) modelling results for the pre-buncher case at 266 nm and for the LPA case at 633 nm are presented. In addition, examples of few-micron beam size and sub-mrad beam divergence measurements from a single shot of an LPA are reported.},

  doi          = {},

  url          = {https://www.osti.gov/biblio/1572510},
  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2019},

  month        = {9}

}

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