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Title: Quantifying Low Energy ICP-MS Isotope Deposition

Abstract

Mass spectrometry (MS) offers an alternative approach to chemical or chromatographic separations to selectively isolate and collect individual isotopes of an element for analytical purposes. During this MS isotopic isolation process, the amount of material deposited on to a target can be conveniently tracked by measuring ion current or accumulated charge. In this paper we report the first study comparing measurment of isotope deposition amount with separated isotope ion current for isotopes of six different elements (88Sr, 107Ag, 133Cs, 140Ce, 175Lu and 205Tl). These isotopes were sequentially deposited on a conductive substrate located in place of the standard electron multiplier in a quadrupole inductively coupled plasma MS. The results indicate good correlation between measured ion current and deposited mass as measured by quantitative analysis. This empirically confirms a means to quantify total mass deposition by ion charge measurements at implantation energies of 5 – 10 eV.

Authors:
 [1]; ORCiD logo [1];  [1];  [1]
  1. BATTELLE (PACIFIC NW LAB)
Publication Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1567259
Report Number(s):
PNNL-SA-138226
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Journal Article
Journal Name:
Journal of Analytical Atomic Spectrometry
Additional Journal Information:
Journal Volume: 34; Journal Issue: 6
Country of Publication:
United States
Language:
English

Citation Formats

Liezers, Martin, Dion, Michael P., Eiden, Gregory C., and Thomas, Linda MP. Quantifying Low Energy ICP-MS Isotope Deposition. United States: N. p., 2019. Web. doi:10.1039/c8ja00447a.
Liezers, Martin, Dion, Michael P., Eiden, Gregory C., & Thomas, Linda MP. Quantifying Low Energy ICP-MS Isotope Deposition. United States. doi:10.1039/c8ja00447a.
Liezers, Martin, Dion, Michael P., Eiden, Gregory C., and Thomas, Linda MP. Sat . "Quantifying Low Energy ICP-MS Isotope Deposition". United States. doi:10.1039/c8ja00447a.
@article{osti_1567259,
title = {Quantifying Low Energy ICP-MS Isotope Deposition},
author = {Liezers, Martin and Dion, Michael P. and Eiden, Gregory C. and Thomas, Linda MP},
abstractNote = {Mass spectrometry (MS) offers an alternative approach to chemical or chromatographic separations to selectively isolate and collect individual isotopes of an element for analytical purposes. During this MS isotopic isolation process, the amount of material deposited on to a target can be conveniently tracked by measuring ion current or accumulated charge. In this paper we report the first study comparing measurment of isotope deposition amount with separated isotope ion current for isotopes of six different elements (88Sr, 107Ag, 133Cs, 140Ce, 175Lu and 205Tl). These isotopes were sequentially deposited on a conductive substrate located in place of the standard electron multiplier in a quadrupole inductively coupled plasma MS. The results indicate good correlation between measured ion current and deposited mass as measured by quantitative analysis. This empirically confirms a means to quantify total mass deposition by ion charge measurements at implantation energies of 5 – 10 eV.},
doi = {10.1039/c8ja00447a},
journal = {Journal of Analytical Atomic Spectrometry},
number = 6,
volume = 34,
place = {United States},
year = {2019},
month = {6}
}

Works referenced in this record:

The production of ultra-high purity single isotopes or tailored isotope mixtures by ICP-MS
journal, January 2015

  • Liezers, M.; Farmer, O. T.; Dion, M. P.
  • International Journal of Mass Spectrometry, Vol. 376, p. 58-64
  • DOI: 10.1016/j.ijms.2014.11.004