HipGISAXS : a high-performance computing code for simulating grazing-incidence X-ray scattering data

Chourou, Slim T.; Sarje, Abhinav; Li, Xiaoye S.; Chan, Elaine R.; Hexemer, Alexander

doi:10.1107/s0021889813025843

Title: HipGISAXS : a high-performance computing code for simulating grazing-incidence X-ray scattering data

Journal Article · Thu Nov 07 00:00:00 EST 2013 · Journal of Applied Crystallography

DOI:https://doi.org/10.1107/s0021889813025843· OSTI ID:1565221

Chourou, Slim T.; Sarje, Abhinav; Li, Xiaoye S.; Chan, Elaine R.; Hexemer, Alexander

This article describes the development of a flexible grazing-incidence small-angle X-ray scattering (GISAXS) simulation code in the framework of the distorted wave Born approximation that effectively utilizes the parallel processing power provided by graphics processors and multicore processors. The code, entitledHigh-Performance GISAXS, computes the GISAXS image for any given superposition of user-defined custom shapes or morphologies in a material and for various grazing-incidence angles and sample orientations. These capabilities permit treatment of a wide range of possible sample structures, including multilayered polymer films and nanoparticles on top of or embedded in a substrate or polymer film layers. In cases where the material displays regions of significant refractive index contrast, an algorithm has been implemented to perform a slicing of the sample and compute the averaged refractive index profile to be used as the reference geometry of the unperturbed system. A number of case studies are presented, which demonstrate good agreement with the experimental data for a variety of polymer and hybrid polymer/nanoparticle composite materials. The parallelized simulation code is well suited for addressing the analysis efforts required by the increasing amounts of GISAXS data being produced by high-speed detectors and ultrafast light sources.

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Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Oak Ridge Leadership Computing Facility (OLCF); Univ. of California, Oakland, CA (United States); UT-Battelle LLC/ORNL, Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: AC02-05CH11231; AC05-00OR22725

OSTI ID:: 1565221

Journal Information:: Journal of Applied Crystallography, Vol. 46, Issue 6; ISSN 0021-8898

Publisher:: International Union of Crystallography

Country of Publication:: United States

Language:: English

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