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Title: Novel Applications of Scanning Ultrafast Electron Microscopy (SUEM).

Abstract

Abstract not provided.

Authors:
;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Sandia National Laboratories, Livermore, CA
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1564040
Report Number(s):
SAND2019-10952
679441
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English

Citation Formats

Nakakura, Craig Y., and Celio, Kimberlee Chiyoko. Novel Applications of Scanning Ultrafast Electron Microscopy (SUEM).. United States: N. p., 2019. Web. doi:10.2172/1564040.
Nakakura, Craig Y., & Celio, Kimberlee Chiyoko. Novel Applications of Scanning Ultrafast Electron Microscopy (SUEM).. United States. doi:10.2172/1564040.
Nakakura, Craig Y., and Celio, Kimberlee Chiyoko. Sun . "Novel Applications of Scanning Ultrafast Electron Microscopy (SUEM).". United States. doi:10.2172/1564040. https://www.osti.gov/servlets/purl/1564040.
@article{osti_1564040,
title = {Novel Applications of Scanning Ultrafast Electron Microscopy (SUEM).},
author = {Nakakura, Craig Y. and Celio, Kimberlee Chiyoko},
abstractNote = {Abstract not provided.},
doi = {10.2172/1564040},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {9}
}